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Ashish Khanna
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Maricopa, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Capacitance-to-voltage interface circuits
Patent number
9,310,409
Issue date
Apr 12, 2016
Freescale Semiconductor Inc.
Ashish Khanna
G01 - MEASURING TESTING
Information
Patent Grant
Capacitance-to-voltage interface circuits
Patent number
8,766,650
Issue date
Jul 1, 2014
FREESCALE SEMICONDUCTOR, INC.
Ashish Khanna
G01 - MEASURING TESTING
Information
Patent Grant
Capacitance-to-voltage interface circuit, and related operating met...
Patent number
8,125,231
Issue date
Feb 28, 2012
FREESCALE SEMICONDUCTOR, INC.
Ashish Khanna
G01 - MEASURING TESTING
Information
Patent Grant
Capacitance-to-voltage interface circuit with shared capacitor bank...
Patent number
7,969,167
Issue date
Jun 28, 2011
FREESCALE SEMICONDUCTOR, INC.
Ashish Khanna
G01 - MEASURING TESTING
Information
Patent Grant
Charge redistribution successive approximation analog-to-digital co...
Patent number
7,796,079
Issue date
Sep 14, 2010
FREESCALE SEMICONDUCTOR, INC.
Ashish Khanna
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
CAPACITANCE-TO-VOLTAGE INTERFACE CIRCUITS
Publication number
20140253148
Publication date
Sep 11, 2014
ASHISH KHANNA
G01 - MEASURING TESTING
Information
Patent Application
CAPACITANCE-TO-VOLTAGE INTERFACE CIRCUITS
Publication number
20120105079
Publication date
May 3, 2012
FREESCALE SEMICONDUCTOR, INC.
Ashish Khanna
G01 - MEASURING TESTING
Information
Patent Application
CHARGE REDISTRIBUTION SUCCESSIVE APPROXIMATION ANALOG-TO-DIGITAL CO...
Publication number
20100188278
Publication date
Jul 29, 2010
FREESCALE SEMICONDUCTOR, INC.
Ashish Khanna
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
CAPACITANCE-TO-VOLTAGE INTERFACE CIRCUIT, AND RELATED OPERATING MET...
Publication number
20100188105
Publication date
Jul 29, 2010
FREESCALE SEMICONDUCTOR, INC.
Ashish Khanna
G01 - MEASURING TESTING
Information
Patent Application
CAPACITANCE-TO-VOLTAGE INTERFACE CIRCUIT WITH SHARED CAPACITOR BANK...
Publication number
20100188107
Publication date
Jul 29, 2010
FREESCALE SEMICONDUCTOR, INC.
Ashish Khanna
G01 - MEASURING TESTING