Ashok Kulkarni

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for generation of wafer inspection critical areas
- Patent number 10,706,522
- Issue date Jul 7, 2020
- KLA-Tencor Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Criticality analysis augmented process window qualification sampling
- Patent number 10,503,078
- Issue date Dec 10, 2019
- KLA-Tencor Corporation
- Jagdish Chandra Saraswatula
- G01 - MEASURING TESTING
Information Patent Grant
Determining one or more characteristics of a pattern of interest on...
- Patent number 10,359,371
- Issue date Jul 23, 2019
- KLA-Tencor Corp.
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image based specimen process control
- Patent number 10,181,185
- Issue date Jan 15, 2019
- KLA-Tencor Corp.
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect sensitivity of semiconductor wafer inspectors using design d...
- Patent number 10,127,651
- Issue date Nov 13, 2018
- KLA-Tencor Corporation
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reducing registration and design vicinity induced noise for intra-d...
- Patent number 10,074,167
- Issue date Sep 11, 2018
- KLA-Tencor Corporation
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating simulated output for a specimen
- Patent number 10,043,261
- Issue date Aug 7, 2018
- KLA-Tencor Corp.
- Kris Bhaskar
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Shape based grouping
- Patent number 9,965,848
- Issue date May 8, 2018
- KLA-Tencor Corporation
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Outlier detection on pattern of interest image populations
- Patent number 9,767,548
- Issue date Sep 19, 2017
- KLA-Tencor Corp.
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using high resolution full die image data for inspection
- Patent number 9,401,016
- Issue date Jul 26, 2016
- KLA-Tencor Corp.
- Ashok V. Kulkarni
- G01 - MEASURING TESTING
Information Patent Grant
Data perturbation for wafer inspection or metrology setup using a m...
- Patent number 9,360,863
- Issue date Jun 7, 2016
- KLA-Tencor Corp.
- Govind Thattaisundaram
- G05 - CONTROLLING REGULATING
Information Patent Grant
Detecting defects on a wafer
- Patent number 9,355,208
- Issue date May 31, 2016
- KLA-Tencor Corp.
- Eugene Shifrin
- G01 - MEASURING TESTING
Information Patent Grant
Inspection recipe setup from reference image variation
- Patent number 9,262,821
- Issue date Feb 16, 2016
- KLA-Tencor Corp.
- Eugene Shifrin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tuning wafer inspection recipes using precise defect locations
- Patent number 9,224,660
- Issue date Dec 29, 2015
- KLA-Tencor Corp.
- Ashok V. Kulkarni
- G01 - MEASURING TESTING
Information Patent Grant
Design-based inspection using repeating structures
- Patent number 9,170,211
- Issue date Oct 27, 2015
- KLA-Tencor Corp.
- Ashok V. Kulkarni
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive sampling for semiconductor inspection recipe creation, def...
- Patent number 9,098,891
- Issue date Aug 4, 2015
- KLA-Tencor Corp.
- Ashok V. Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated inspection scenario generation
- Patent number 9,053,390
- Issue date Jun 9, 2015
- KLA-Tencor Corporation
- Mohan Mahadevan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Digital pathology system
- Patent number 9,041,930
- Issue date May 26, 2015
- KLA-Tencor Corporation
- Scott Young
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic care areas
- Patent number 8,781,781
- Issue date Jul 15, 2014
- KLA-Tencor Corp.
- Ashok V. Kulkarni
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor device property extraction, generation, visualization...
- Patent number 8,611,639
- Issue date Dec 17, 2013
- KLA-Tencor Technologies Corp.
- Ashok Kulkarni
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for hierarchical tissue analysis and classification
- Patent number 8,600,143
- Issue date Dec 3, 2013
- KLA-Tencor Corporation
- Ashok V. Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for utilizing design data in combination with i...
- Patent number 8,139,843
- Issue date Mar 20, 2012
- KLA-Tencor Technologies Corp.
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for creating persistent data for a wafer and fo...
- Patent number 8,126,255
- Issue date Feb 28, 2012
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer-implemented methods for detecting and/or sorting defects i...
- Patent number 8,111,900
- Issue date Feb 7, 2012
- KLA-Tencor Technologies Corp.
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a position of inspection data i...
- Patent number 8,041,103
- Issue date Oct 18, 2011
- KLA-Tencor Technologies Corp.
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for creating inspection recipes
- Patent number 7,877,722
- Issue date Jan 25, 2011
- KLA-Tencor Corp.
- Brian Duffy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems and methods for detecting defects on a wafer and generating...
- Patent number 7,756,658
- Issue date Jul 13, 2010
- KLA-Tencor Corp.
- Ashok Kulkarni
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Computer-implemented methods for detecting and/or sorting defects i...
- Patent number 7,729,529
- Issue date Jun 1, 2010
- KLA-Tencor Technologies Corp.
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for detecting defects on a specimen using a com...
- Patent number 7,711,177
- Issue date May 4, 2010
- KLA-Tencor Technologies Corp.
- Brian Leslie
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for utilizing design data in combination with i...
- Patent number 7,676,077
- Issue date Mar 9, 2010
- KLA-Tencor Technologies Corp.
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CRITICALITY ANALYSIS AUGMENTED PROCESS WINDOW QUALIFICATION SAMPLING
- Publication number 20190072858
- Publication date Mar 7, 2019
- KLA-Tencor Corporation
- Jagdish Chandra SARASWATULA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and Method for Generation of Wafer Inspection Critical Areas
- Publication number 20180130195
- Publication date May 10, 2018
- KLA-Tencor Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT SENSITIVITY OF SEMICONDUCTOR WAFER INSPECTORS USING DESIGN D...
- Publication number 20170206650
- Publication date Jul 20, 2017
- KLA-Tencor Corporation
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE BASED SPECIMEN PROCESS CONTROL
- Publication number 20170200264
- Publication date Jul 13, 2017
- KLA-Tencor Corporation
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING SIMULATED OUTPUT FOR A SPECIMEN
- Publication number 20170200265
- Publication date Jul 13, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE BASED GROUPING
- Publication number 20170186151
- Publication date Jun 29, 2017
- KLA-Tencor Corporation
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REDUCING REGISTRATION AND DESIGN VICINITY INDUCED NOISE FOR INTRA-D...
- Publication number 20170161888
- Publication date Jun 8, 2017
- KLA-Tencor Corporation
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Determining One or More Characteristics of a Pattern of Interest on...
- Publication number 20170059491
- Publication date Mar 2, 2017
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
Outlier Detection on Pattern of Interest Image Populations
- Publication number 20160314578
- Publication date Oct 27, 2016
- KLA-Tencor Corporation
- Saibal Banerjee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection Recipe Setup from Reference Image Variation
- Publication number 20150324964
- Publication date Nov 12, 2015
- KLA-Tencor Corporation
- Eugene Shifrin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Using High Resolution Full Die Image Data for Inspection
- Publication number 20150324965
- Publication date Nov 12, 2015
- KLA-Tencor Corporation
- Ashok V. Kulkarni
- G01 - MEASURING TESTING
Information Patent Application
Tuning Wafer Inspection Recipes Using Precise Defect Locations
- Publication number 20150062571
- Publication date Mar 5, 2015
- KLA-Tencor Corporation
- Ashok V. Kulkarni
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Detecting Repeating Defects on Semiconducto...
- Publication number 20150012900
- Publication date Jan 8, 2015
- KLA-Tencor Corporation
- Eugene Shifrin
- G01 - MEASURING TESTING
Information Patent Application
Adaptive Sampling for Semiconductor Inspection Recipe Creation, Def...
- Publication number 20140301630
- Publication date Oct 9, 2014
- KLA-Tencor Corporation
- Ashok V. Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automated Inspection Scenario Generation
- Publication number 20140050389
- Publication date Feb 20, 2014
- KLA-Tencor Corporation
- Mohan Mahadevan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Design-Based Inspection Using Repeating Structures
- Publication number 20120243773
- Publication date Sep 27, 2012
- KLA-Tencor Corporation
- Ashok V. Kulkarni
- G01 - MEASURING TESTING
Information Patent Application
Data Perturbation for Wafer Inspection or Metrology Setup
- Publication number 20120116733
- Publication date May 10, 2012
- KLA-Tencor Corporation
- Govind Thattaisundaram
- G05 - CONTROLLING REGULATING
Information Patent Application
DYNAMIC CARE AREAS
- Publication number 20120029858
- Publication date Feb 2, 2012
- KLA-Tencor Corporation
- Ashok V. Kulkarni
- G05 - CONTROLLING REGULATING
Information Patent Application
METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH I...
- Publication number 20110286656
- Publication date Nov 24, 2011
- KLA-Tencor Technologies Corporation
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH I...
- Publication number 20100119144
- Publication date May 13, 2010
- KLA-Tencor Technologies Corporation
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER AND GENERATING...
- Publication number 20090287440
- Publication date Nov 19, 2009
- Ashok Kulkarni
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEMS AND METHODS FOR CREATING PERSISTENT DATA FOR A WAFER AND FO...
- Publication number 20090080759
- Publication date Mar 26, 2009
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE PROPERTY EXTRACTION, GENERATION, VISUALIZATION...
- Publication number 20090037134
- Publication date Feb 5, 2009
- Ashok Kulkarni
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CREATING INSPECTION RECIPES
- Publication number 20080250384
- Publication date Oct 9, 2008
- Brian Duffy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods and Systems for Detecting Defects on a Specimen Using a Com...
- Publication number 20070286473
- Publication date Dec 13, 2007
- KLA-TENCOR TECHNOLOGIES CORP.
- Brian Leslie
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR DETERMINING A POSITION OF INSPECTION DATA I...
- Publication number 20070230770
- Publication date Oct 4, 2007
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH I...
- Publication number 20070156379
- Publication date Jul 5, 2007
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Computer-implemented methods for detecting and/or sorting defects i...
- Publication number 20060291714
- Publication date Dec 28, 2006
- Kenong Wu
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20060265145
- Publication date Nov 23, 2006
- Patrick Huet
- G06 - COMPUTING CALCULATING COUNTING

Ashok Kulkarni

Person

Patents Grantslast 30 patents

System and method for generation of wafer inspection critical areas

Criticality analysis augmented process window qualification sampling

Determining one or more characteristics of a pattern of interest on...

Image based specimen process control

Defect sensitivity of semiconductor wafer inspectors using design d...

Reducing registration and design vicinity induced noise for intra-d...

Generating simulated output for a specimen

Shape based grouping

Outlier detection on pattern of interest image populations

Using high resolution full die image data for inspection

Data perturbation for wafer inspection or metrology setup using a m...

Detecting defects on a wafer

Inspection recipe setup from reference image variation

Tuning wafer inspection recipes using precise defect locations

Design-based inspection using repeating structures

Adaptive sampling for semiconductor inspection recipe creation, def...

Automated inspection scenario generation

Digital pathology system

Dynamic care areas

Semiconductor device property extraction, generation, visualization...

Method and system for hierarchical tissue analysis and classification

Methods and systems for utilizing design data in combination with i...

Systems and methods for creating persistent data for a wafer and fo...

Computer-implemented methods for detecting and/or sorting defects i...

Methods and systems for determining a position of inspection data i...

Systems and methods for creating inspection recipes

Systems and methods for detecting defects on a wafer and generating...

Computer-implemented methods for detecting and/or sorting defects i...

Methods and systems for detecting defects on a specimen using a com...

Methods and systems for utilizing design data in combination with i...

Patents Applicationslast 30 patents

CRITICALITY ANALYSIS AUGMENTED PROCESS WINDOW QUALIFICATION SAMPLING

System and Method for Generation of Wafer Inspection Critical Areas

DEFECT SENSITIVITY OF SEMICONDUCTOR WAFER INSPECTORS USING DESIGN D...

IMAGE BASED SPECIMEN PROCESS CONTROL

GENERATING SIMULATED OUTPUT FOR A SPECIMEN

SHAPE BASED GROUPING

REDUCING REGISTRATION AND DESIGN VICINITY INDUCED NOISE FOR INTRA-D...

Determining One or More Characteristics of a Pattern of Interest on...

Outlier Detection on Pattern of Interest Image Populations

Inspection Recipe Setup from Reference Image Variation

Using High Resolution Full Die Image Data for Inspection

Tuning Wafer Inspection Recipes Using Precise Defect Locations

Methods and Systems for Detecting Repeating Defects on Semiconducto...

Adaptive Sampling for Semiconductor Inspection Recipe Creation, Def...

Automated Inspection Scenario Generation

Design-Based Inspection Using Repeating Structures

Data Perturbation for Wafer Inspection or Metrology Setup

DYNAMIC CARE AREAS

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH I...

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH I...

SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER AND GENERATING...

SYSTEMS AND METHODS FOR CREATING PERSISTENT DATA FOR A WAFER AND FO...

SEMICONDUCTOR DEVICE PROPERTY EXTRACTION, GENERATION, VISUALIZATION...

SYSTEMS AND METHODS FOR CREATING INSPECTION RECIPES

Methods and Systems for Detecting Defects on a Specimen Using a Com...

METHODS AND SYSTEMS FOR DETERMINING A POSITION OF INSPECTION DATA I...

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH I...

Computer-implemented methods for detecting and/or sorting defects i...

FLEXIBLE HYBRID DEFECT CLASSIFICATION FOR SEMICONDUCTOR MANUFACTURING