Ashutosh Anand

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Gangalore, IN

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Patents Grantslast 30 patents

Information Patent Grant
Continuous write and read operations for memories with latencies
- Patent number 9,972,402
- Issue date May 15, 2018
- QUALCOMM Incorporated
- Nishi Bhushan Singh
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for multiple memory shared collar architecture
- Patent number 9,971,663
- Issue date May 15, 2018
- QUALCOMM Incorporated
- Nishi Bhushan Singh
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for optimized memory test status detection and...
- Patent number 9,711,241
- Issue date Jul 18, 2017
- QUALCOMM Incorporated
- Ashutosh Anand
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan testing of integrated circuits and on-chip modules
- Patent number 8,645,779
- Issue date Feb 4, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Rajan Aggarwal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTINUOUS WRITE AND READ OPERATIONS FOR MEMORIES WITH LATENCIES
- Publication number 20170309348
- Publication date Oct 26, 2017
- QUALCOMM Incorporated
- Nishi Bhushan Singh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED MEMORY BUILT-IN SELF-TEST ARCHITECTURE FOR DE-FEATURED MEM...
- Publication number 20170110204
- Publication date Apr 20, 2017
- QUALCOMM Incorporated
- Abhinav Kothiala
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR OPTIMIZED MEMORY TEST STATUS DETECTION AND...
- Publication number 20160293272
- Publication date Oct 6, 2016
- QUALCOMM Incorporated
- Ashutosh Anand
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS TO TEST SECURE BLOCKS USING A NON-STANDARD INT...
- Publication number 20160077151
- Publication date Mar 17, 2016
- QUALCOMM Incorporated
- Ashutosh Anand
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MULTIPLE MEMORY SHARED COLLAR ARCHITECTURE
- Publication number 20160062864
- Publication date Mar 3, 2016
- QUALCOMM Incorporated
- Nishi Bhushan Singh
- G01 - MEASURING TESTING
Information Patent Application
SCAN TESTING OF INTEGRATED CIRCUITS AND ON-CHIP MODULES
- Publication number 20130346819
- Publication date Dec 26, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Rajan Aggarwal
- G01 - MEASURING TESTING