Assaf ASBAG

Person

Alfei Menashe, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of deep learning-based examination of a semiconductor specim...
- Patent number 11,568,531
- Issue date Jan 31, 2023
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of defect classification and system thereof
- Patent number 11,526,979
- Issue date Dec 13, 2022
- Applied Materials Israel Ltd.
- Assaf Asbag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of classifying defects in a specimen semiconductor examinati...
- Patent number 11,321,633
- Issue date May 3, 2022
- Applied Materials Israel Ltd.
- Assaf Asbag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating a training set usable for examination of a semiconductor...
- Patent number 11,199,506
- Issue date Dec 14, 2021
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of classifying defects in a semiconductor specimen and syste...
- Patent number 11,151,706
- Issue date Oct 19, 2021
- APPLIED MATERIAL ISRAEL, LTD.
- Kirill Savchenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for classifying a multi...
- Patent number 11,138,507
- Issue date Oct 5, 2021
- Applied Materials Israel Ltd.
- Assaf Asbag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of classifying defects in a semiconductor specimen and syste...
- Patent number 11,037,286
- Issue date Jun 15, 2021
- Applied Materials Israel Ltd.
- Assaf Asbag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for classifying defects
- Patent number 10,921,334
- Issue date Feb 16, 2021
- Applied Materials Israel Ltd.
- Kirill Savchenko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of generating a training set usable for examination of a sem...
- Patent number 10,832,092
- Issue date Nov 10, 2020
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for generating a traini...
- Patent number 10,803,575
- Issue date Oct 13, 2020
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of defect classification and system thereof
- Patent number 10,748,271
- Issue date Aug 18, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Assaf Asbag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for generating a traini...
- Patent number 10,360,669
- Issue date Jul 23, 2019
- Applied Materials Israel Ltd.
- Ohad Shaubi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DEFECT CLASSIFICATION AND SYSTEM THEREOF
- Publication number 20200372631
- Publication date Nov 26, 2020
- APPLIED MATERIALS ISRAEL, LTD.
- Assaf ASBAG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...
- Publication number 20200294224
- Publication date Sep 17, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF CLASSIFYING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTE...
- Publication number 20200226743
- Publication date Jul 16, 2020
- Kirill SAVCHENKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method Of Generating A Training Set Usable For Examination Of A Sem...
- Publication number 20200226420
- Publication date Jul 16, 2020
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR OUTLIER DETECTION USING A CASCADE OF NEURAL N...
- Publication number 20200210809
- Publication date Jul 2, 2020
- Playtika Ltd.
- Idan KAIZERMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF CLASSIFYING DEFECTS IN A SPECIMEN SEMICONDUCTOR EXAMINATI...
- Publication number 20200202252
- Publication date Jun 25, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Assaf ASBAG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR GENERATING A TRAINI...
- Publication number 20190347785
- Publication date Nov 14, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DEFECT CLASSIFICATION AND SYSTEM THEREOF
- Publication number 20190333208
- Publication date Oct 31, 2019
- APPLIED MATERIALS ISRAEL, LTD.
- Assaf ASBAG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFYING DEFECTS
- Publication number 20190293669
- Publication date Sep 26, 2019
- Applied Materials Israel Ltd.
- Kirill SAVCHENKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GENERATING A TRAINING SET USABLE FOR EXAMINATION OF A SEMICONDUCTOR...
- Publication number 20190257767
- Publication date Aug 22, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF CLASSIFYING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTE...
- Publication number 20190096053
- Publication date Mar 28, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Assaf ASBAG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFYING A MULTI...
- Publication number 20190095800
- Publication date Mar 28, 2019
- Assaf ASBAG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR GENERATING A TRAINI...
- Publication number 20190066290
- Publication date Feb 28, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Ohad SHAUBI
- G06 - COMPUTING CALCULATING COUNTING

Assaf ASBAG

Person

Patents Grantslast 30 patents

Method of deep learning-based examination of a semiconductor specim...

Method of defect classification and system thereof

Method of classifying defects in a specimen semiconductor examinati...

Generating a training set usable for examination of a semiconductor...

Method of classifying defects in a semiconductor specimen and syste...

System, method and computer program product for classifying a multi...

Method of classifying defects in a semiconductor specimen and syste...

System, method and computer program product for classifying defects

Method of generating a training set usable for examination of a sem...

System, method and computer program product for generating a traini...

Method of defect classification and system thereof

System, method and computer program product for generating a traini...

Patents Applicationslast 30 patents

METHOD OF DEFECT CLASSIFICATION AND SYSTEM THEREOF

METHOD OF DEEP LEARNING-BASED EXAMINATION OF A SEMICONDUCTOR SPECIM...

METHOD OF CLASSIFYING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTE...

Method Of Generating A Training Set Usable For Examination Of A Sem...

SYSTEM AND METHOD FOR OUTLIER DETECTION USING A CASCADE OF NEURAL N...

METHOD OF CLASSIFYING DEFECTS IN A SPECIMEN SEMICONDUCTOR EXAMINATI...

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR GENERATING A TRAINI...

METHOD OF DEFECT CLASSIFICATION AND SYSTEM THEREOF

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFYING DEFECTS

GENERATING A TRAINING SET USABLE FOR EXAMINATION OF A SEMICONDUCTOR...

METHOD OF CLASSIFYING DEFECTS IN A SEMICONDUCTOR SPECIMEN AND SYSTE...

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR CLASSIFYING A MULTI...

SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR GENERATING A TRAINI...