Aswin Thiruvengadam

Person

Folsom, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Selectable trim settings on a memory device
- Patent number 11,854,634
- Issue date Dec 26, 2023
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Configurable trim settings on a memory device
- Patent number 11,853,207
- Issue date Dec 26, 2023
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trim setting determination on a memory device
- Patent number 11,836,078
- Issue date Dec 5, 2023
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trim setting determination for a memory device
- Patent number 11,817,164
- Issue date Nov 14, 2023
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Standalone thermal chamber for a temperature control component
- Patent number 11,808,803
- Issue date Nov 7, 2023
- Micron Technology, Inc.
- Daniel G. Scobee
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Allocation of test resources to perform a test of memory components
- Patent number 11,808,806
- Issue date Nov 7, 2023
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of memory sub-systems based on threshold distributions
- Patent number 11,783,185
- Issue date Oct 10, 2023
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermal control component
- Patent number D995530
- Issue date Aug 15, 2023
- Micron Technology, Inc.
- Daniel G. Scobee
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Thermal chamber for a thermal control component
- Patent number 11,658,175
- Issue date May 23, 2023
- Micron Technology, Inc.
- Daniel G. Scobee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Standalone thermal chamber for a temperature control component
- Patent number 11,493,550
- Issue date Nov 8, 2022
- Micron Technology, Inc.
- Daniel G. Scobee
- G01 - MEASURING TESTING
Information Patent Grant
Thermal control component
- Patent number D954712
- Issue date Jun 14, 2022
- Micron Technology, Inc.
- Daniel G. Scobee
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Temperature control component for electronic systems
- Patent number 11,334,129
- Issue date May 17, 2022
- Micron Technology, Inc.
- Daniel G. Scobee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis of memory sub-systems based on threshold distributions
- Patent number 11,295,209
- Issue date Apr 5, 2022
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trim setting determination for a memory device
- Patent number 11,264,112
- Issue date Mar 1, 2022
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Management of test resources to perform testing of memory component...
- Patent number 11,257,565
- Issue date Feb 22, 2022
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trim setting determination on a memory device
- Patent number 11,226,896
- Issue date Jan 18, 2022
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Allocation of test resources to perform a test of memory components
- Patent number 11,131,705
- Issue date Sep 28, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Grant
Thermal chamber for a thermal control component
- Patent number 11,121,125
- Issue date Sep 14, 2021
- Micron Technology, Inc.
- Daniel G. Scobee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-dimensional usage space testing of memory components
- Patent number 11,101,015
- Issue date Aug 24, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Performing a test of memory components with fault tolerance
- Patent number 11,043,269
- Issue date Jun 22, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G11 - INFORMATION STORAGE
Information Patent Grant
Configurable trim settings on a memory device
- Patent number 11,036,631
- Issue date Jun 15, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Management of test resources to perform reliability testing of memo...
- Patent number 10,910,081
- Issue date Feb 2, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trim setting determination for a memory device
- Patent number 10,861,573
- Issue date Dec 8, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selectable trim settings on a memory device
- Patent number 10,777,292
- Issue date Sep 15, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trim setting determination on a memory device
- Patent number 10,761,980
- Issue date Sep 1, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermal control component
- Patent number D893484
- Issue date Aug 18, 2020
- Micron Technology, Inc.
- Daniel G. Scobee
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Performing a test of memory components with fault tolerance
- Patent number 10,672,470
- Issue date Jun 2, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G11 - INFORMATION STORAGE
Information Patent Grant
Compensation for threshold voltage variation of memory cell components
- Patent number 10,607,675
- Issue date Mar 31, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G11 - INFORMATION STORAGE
Information Patent Grant
Trim setting determination for a memory device
- Patent number 10,535,415
- Issue date Jan 14, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selectable trim settings on a memory device
- Patent number 10,431,319
- Issue date Oct 1, 2019
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TRIM SETTING DETERMINATION ON A MEMORY DEVICE
- Publication number 20240211395
- Publication date Jun 27, 2024
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTABLE TRIM SETTINGS ON A MEMORY DEVICE
- Publication number 20240203516
- Publication date Jun 20, 2024
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRIM SETTING DETERMINATION FOR A MEMORY DEVICE
- Publication number 20240161846
- Publication date May 16, 2024
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STANDALONE THERMAL CHAMBER FOR A TEMPERATURE CONTROL COMPONENT
- Publication number 20230046331
- Publication date Feb 16, 2023
- Micron Technology, Inc.
- Daniel G. Scobee
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CONTROL COMPONENT FOR ELECTRONIC SYSTEMS
- Publication number 20220244765
- Publication date Aug 4, 2022
- Micron Technology, Inc.
- Daniel G. SCOBEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS OF MEMORY SUB-SYSTEMS BASED ON THRESHOLD DISTRIBUTIONS
- Publication number 20220215261
- Publication date Jul 7, 2022
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRIM SETTING DETERMINATION FOR A MEMORY DEVICE
- Publication number 20220180954
- Publication date Jun 9, 2022
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRIM SETTING DETERMINATION ON A MEMORY DEVICE
- Publication number 20220138100
- Publication date May 5, 2022
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THERMAL CHAMBER FOR A THERMAL CONTROL COMPONENT
- Publication number 20210391319
- Publication date Dec 16, 2021
- Micron Technology, Inc.
- Daniel G. Scobee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALLOCATION OF TEST RESOURCES TO PERFORM A TEST OF MEMORY COMPONENTS
- Publication number 20210373072
- Publication date Dec 2, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE TRIM SETTINGS ON A MEMORY DEVICE
- Publication number 20210286722
- Publication date Sep 16, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS OF MEMORY SUB-SYSTEMS BASED ON THRESHOLD DISTRIBUTIONS
- Publication number 20210192333
- Publication date Jun 24, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE CONTROL COMPONENT FOR ELECTRONIC SYSTEMS
- Publication number 20210181819
- Publication date Jun 17, 2021
- Micron Technology, Inc.
- Daniel G. SCOBEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STANDALONE THERMAL CHAMBER FOR A TEMPERATURE CONTROL COMPONENT
- Publication number 20210181249
- Publication date Jun 17, 2021
- Micron Technology, Inc.
- Daniel G. Scobee
- G01 - MEASURING TESTING
Information Patent Application
MANAGEMENT OF TEST RESOURCES TO PERFORM TESTING OF MEMORY COMPONENT...
- Publication number 20210134385
- Publication date May 6, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRIM SETTING DETERMINATION FOR A MEMORY DEVICE
- Publication number 20210090674
- Publication date Mar 25, 2021
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTABLE TRIM SETTINGS ON A MEMORY DEVICE
- Publication number 20200395091
- Publication date Dec 17, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRIM SETTING DETERMINATION ON A MEMORY DEVICE
- Publication number 20200394135
- Publication date Dec 17, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PERFORMING A TEST OF MEMORY COMPONENTS WITH FAULT TOLERANCE
- Publication number 20200294587
- Publication date Sep 17, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G11 - INFORMATION STORAGE
Information Patent Application
MULTI-DIMENSIONAL USAGE SPACE TESTING OF MEMORY COMPONENTS
- Publication number 20200194092
- Publication date Jun 18, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G11 - INFORMATION STORAGE
Information Patent Application
DUAL THERMOELECTRIC COMPONENT APPARATUS WITH THERMAL TRANSFER COMPO...
- Publication number 20200194650
- Publication date Jun 18, 2020
- Micron Technology, Inc.
- Daniel G. Scobee
- G01 - MEASURING TESTING
Information Patent Application
THERMAL CHAMBER FOR A THERMAL CONTROL COMPONENT
- Publication number 20200194420
- Publication date Jun 18, 2020
- Micron Technology, Inc.
- Daniel G. Scobee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANAGEMENT OF TEST RESOURCES TO PERFORM RELIABILITY TESTING OF MEMO...
- Publication number 20200194091
- Publication date Jun 18, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G11 - INFORMATION STORAGE
Information Patent Application
PERFORMING A TEST OF MEMORY COMPONENTS WITH FAULT TOLERANCE
- Publication number 20200176057
- Publication date Jun 4, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G11 - INFORMATION STORAGE
Information Patent Application
ALLOCATION OF TEST RESOURCES TO PERFORM A TEST OF MEMORY COMPONENTS
- Publication number 20200174064
- Publication date Jun 4, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G01 - MEASURING TESTING
Information Patent Application
TRIM SETTING DETERMINATION FOR A MEMORY DEVICE
- Publication number 20200035318
- Publication date Jan 30, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTABLE TRIM SETTINGS ON A MEMORY DEVICE
- Publication number 20200027517
- Publication date Jan 23, 2020
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRIM SETTING DETERMINATION ON A MEMORY DEVICE
- Publication number 20190303290
- Publication date Oct 3, 2019
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRIM SETTING DETERMINATION ON A MEMORY DEVICE
- Publication number 20190138443
- Publication date May 9, 2019
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONFIGURABLE TRIM SETTINGS ON A MEMORY DEVICE
- Publication number 20190138442
- Publication date May 9, 2019
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING

Aswin Thiruvengadam

Person

Patents Grantslast 30 patents

Selectable trim settings on a memory device

Configurable trim settings on a memory device

Trim setting determination on a memory device

Trim setting determination for a memory device

Standalone thermal chamber for a temperature control component

Allocation of test resources to perform a test of memory components

Analysis of memory sub-systems based on threshold distributions

Thermal control component

Thermal chamber for a thermal control component

Standalone thermal chamber for a temperature control component

Thermal control component

Temperature control component for electronic systems

Analysis of memory sub-systems based on threshold distributions

Trim setting determination for a memory device

Management of test resources to perform testing of memory component...

Trim setting determination on a memory device

Allocation of test resources to perform a test of memory components

Thermal chamber for a thermal control component

Multi-dimensional usage space testing of memory components

Performing a test of memory components with fault tolerance

Configurable trim settings on a memory device

Management of test resources to perform reliability testing of memo...

Trim setting determination for a memory device

Selectable trim settings on a memory device

Trim setting determination on a memory device

Thermal control component

Performing a test of memory components with fault tolerance

Compensation for threshold voltage variation of memory cell components

Trim setting determination for a memory device

Selectable trim settings on a memory device

Patents Applicationslast 30 patents

TRIM SETTING DETERMINATION ON A MEMORY DEVICE

SELECTABLE TRIM SETTINGS ON A MEMORY DEVICE

TRIM SETTING DETERMINATION FOR A MEMORY DEVICE

STANDALONE THERMAL CHAMBER FOR A TEMPERATURE CONTROL COMPONENT

TEMPERATURE CONTROL COMPONENT FOR ELECTRONIC SYSTEMS

ANALYSIS OF MEMORY SUB-SYSTEMS BASED ON THRESHOLD DISTRIBUTIONS

TRIM SETTING DETERMINATION FOR A MEMORY DEVICE

TRIM SETTING DETERMINATION ON A MEMORY DEVICE

THERMAL CHAMBER FOR A THERMAL CONTROL COMPONENT

ALLOCATION OF TEST RESOURCES TO PERFORM A TEST OF MEMORY COMPONENTS

CONFIGURABLE TRIM SETTINGS ON A MEMORY DEVICE

ANALYSIS OF MEMORY SUB-SYSTEMS BASED ON THRESHOLD DISTRIBUTIONS

TEMPERATURE CONTROL COMPONENT FOR ELECTRONIC SYSTEMS

STANDALONE THERMAL CHAMBER FOR A TEMPERATURE CONTROL COMPONENT

MANAGEMENT OF TEST RESOURCES TO PERFORM TESTING OF MEMORY COMPONENT...

TRIM SETTING DETERMINATION FOR A MEMORY DEVICE

SELECTABLE TRIM SETTINGS ON A MEMORY DEVICE

TRIM SETTING DETERMINATION ON A MEMORY DEVICE

PERFORMING A TEST OF MEMORY COMPONENTS WITH FAULT TOLERANCE

MULTI-DIMENSIONAL USAGE SPACE TESTING OF MEMORY COMPONENTS

DUAL THERMOELECTRIC COMPONENT APPARATUS WITH THERMAL TRANSFER COMPO...

THERMAL CHAMBER FOR A THERMAL CONTROL COMPONENT

MANAGEMENT OF TEST RESOURCES TO PERFORM RELIABILITY TESTING OF MEMO...

PERFORMING A TEST OF MEMORY COMPONENTS WITH FAULT TOLERANCE

ALLOCATION OF TEST RESOURCES TO PERFORM A TEST OF MEMORY COMPONENTS

TRIM SETTING DETERMINATION FOR A MEMORY DEVICE

SELECTABLE TRIM SETTINGS ON A MEMORY DEVICE

TRIM SETTING DETERMINATION ON A MEMORY DEVICE

TRIM SETTING DETERMINATION ON A MEMORY DEVICE

CONFIGURABLE TRIM SETTINGS ON A MEMORY DEVICE