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ATSUHIKO OKADA

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Patents Grantslast 30 patents

  • Information Patent Grant

    Measurement device and measurement method
    • Patent number 11,041,824
    • Issue date Jun 22, 2021
    • Lapis Semiconductor Co., Ltd.
    • Kenichiro Kusano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measurement device
    • Patent number 10,794,854
    • Issue date Oct 6, 2020
    • Lapis Semiconductor Co., Ltd.
    • Atsuhiko Okada
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    MEASUREMENT DEVICE AND MEASUREMENT METHOD
    • Publication number 20190360962
    • Publication date Nov 28, 2019
    • LAPIS SEMICONDUCTOR CO., LTD.
    • KENICHIRO KUSANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASUREMENT DEVICE
    • Publication number 20190128839
    • Publication date May 2, 2019
    • LAPIS SEMICONDUCTOR CO., LTD.
    • ATSUHIKO OKADA
    • G01 - MEASURING TESTING