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Atsuhito Fukasawa

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  • Hamamatsu-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Electron tube comprising a focusing electrode part having a light p...
    • Patent number 11,118,969
    • Issue date Sep 14, 2021
    • Hamamatsu Photonics K.K.
    • Atsuhito Fukasawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electron tube
    • Patent number 8,203,266
    • Issue date Jun 19, 2012
    • Hamamatsu Photonics K.K.
    • Yasuyuki Egawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Electron tube
    • Patent number 8,080,806
    • Issue date Dec 20, 2011
    • Hamamatsu Photonics K.K.
    • Motohiro Suyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Electron tube
    • Patent number 8,040,060
    • Issue date Oct 18, 2011
    • Hamamatsu Photonics K.K.
    • Atsuhito Fukasawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Electron tube
    • Patent number 7,876,033
    • Issue date Jan 25, 2011
    • Hamamatsu Photonics K.K.
    • Tomohiro Ishizu
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Electron tube
    • Patent number 7,692,384
    • Issue date Apr 6, 2010
    • Hamamatsu Photonics K.K.
    • Hiroyuki Kyushima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Electron tube with electron-bombarded semiconductor device
    • Patent number 7,525,249
    • Issue date Apr 28, 2009
    • Hamamatsu Photonics K.K.
    • Motohiro Suyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Electron beam detection device and electron tube
    • Patent number 7,491,918
    • Issue date Feb 17, 2009
    • Hamamatsu Photonics K.K.
    • Hiroyuki Kyushima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Electron tube
    • Patent number 7,176,429
    • Issue date Feb 13, 2007
    • Hamamatsu Photonics K.K.
    • Motohiro Suyama
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTRON TUBE
    • Publication number 20200149959
    • Publication date May 14, 2020
    • Hamamatsu Photonics K.K.
    • Atsuhito FUKASAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRON TUBE
    • Publication number 20100102701
    • Publication date Apr 29, 2010
    • HAMAMATSU PHOTONICS K. K.
    • Tomohiro ISHIZU
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON TUBE
    • Publication number 20100102721
    • Publication date Apr 29, 2010
    • HAMAMATSU PHOTONICS K. K.
    • Atsuhito FUKASAWA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON TUBE
    • Publication number 20100102720
    • Publication date Apr 29, 2010
    • Hamamatsu Photonics K. K.
    • Yasuyuki EGAWA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON TUBE
    • Publication number 20100102408
    • Publication date Apr 29, 2010
    • HAMAMATSU PHOTONICS K. K.
    • Motohiro SUYAMA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Electron tube
    • Publication number 20070029930
    • Publication date Feb 8, 2007
    • Hamamatsu Photonics K. K.
    • Motohiro Suyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Electron beam detection device and electron tube
    • Publication number 20070023652
    • Publication date Feb 1, 2007
    • HAMAMATSU PHOTONICS K. K.
    • Hiroyuki Kyushima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Electron tube
    • Publication number 20070001093
    • Publication date Jan 4, 2007
    • HAMAMATSU PHOTONICS K. K.
    • Motohiro Suyama
    • H01 - BASIC ELECTRIC ELEMENTS