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Atsuko Kubota
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Yokohama, JP
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last 30 patents
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Patent Grant
Semiconductor silicon wafer and process for producing it
Patent number
5,738,942
Issue date
Apr 14, 1998
Kabushiki Kaisha Toshiba
Atsuko Kubota
C30 - CRYSTAL GROWTH
Information
Patent Grant
Process for producing Semiconductor silicon wafer
Patent number
5,534,294
Issue date
Jul 9, 1996
Kabushiki Kaisha Toshiba
Atsuko Kubota
C30 - CRYSTAL GROWTH
Information
Patent Grant
Semiconductor substrate, method of manufacturing semiconductor subs...
Patent number
5,508,800
Issue date
Apr 16, 1996
Kabushiki Kaisha Toshiba
Moriya Miyashita
G01 - MEASURING TESTING
Information
Patent Grant
System for analyzing metal impurity on the surface of a single crys...
Patent number
5,148,457
Issue date
Sep 15, 1992
Kabushiki Kaisha Toshiba
Atsuko Kubota
G01 - MEASURING TESTING
Information
Patent Grant
Wafer processsing method for manufacturing wafers having contaminan...
Patent number
5,071,776
Issue date
Dec 10, 1991
Kabushiki Kaisha Toshiba
Yoshiaki Matsushita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for predicting density of micro crystal defects in semicondu...
Patent number
4,862,000
Issue date
Aug 29, 1989
Kabushiki Kaisha Toshiba
Atsuko Kubota
G01 - MEASURING TESTING