Atsuko Otsuka

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Higashihiroshima, Hiroshima, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test circuit in scribe region for memory failure analysis
- Patent number 11,854,639
- Issue date Dec 26, 2023
- Micron Technology, Inc.
- Atsuko Otsuka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor devices including transistors comprising a charge tra...
- Patent number 10,833,087
- Issue date Nov 10, 2020
- Micron Technology, Inc.
- Fredrick D. Fishburn
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRO-OPTICAL PROBING AND MECHANICAL MICROPROBING OF MEMORY DIE U...
- Publication number 20250123305
- Publication date Apr 17, 2025
- Micron Technology, Inc.
- Soeparto Tandjoeng
- G01 - MEASURING TESTING
Information Patent Application
EOP PROBING ON MULTI-DIE STACKS
- Publication number 20240201252
- Publication date Jun 20, 2024
- Micron Technology, Inc.
- John M. Gonzales
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT IN SCRIBE REGION FOR MEMORY FAILURE ANALYSIS
- Publication number 20230326540
- Publication date Oct 12, 2023
- Micron Technology, Inc.
- ATSUKO OTSUKA
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICES INCLUDING TRANSISTORS COMPRISING A CHARGE TRA...
- Publication number 20200066726
- Publication date Feb 27, 2020
- Micron Technology, Inc.
- Fredrick D. Fishburn
- H01 - BASIC ELECTRIC ELEMENTS