Atsuko SHINTANI

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Patents Grantslast 30 patents

Information Patent Grant
Pattern shape evaluation device, pattern shape evaluation system, a...
- Patent number 11,713,963
- Issue date Aug 1, 2023
- HITACHI HIGH-TECH CORPORATION
- Atsuko Shintani
- G01 - MEASURING TESTING
Information Patent Grant
Image processing device, image processing method and charged partic...
- Patent number 11,430,106
- Issue date Aug 30, 2022
- HITACHI HIGH-TECH CORPORATION
- Takeyoshi Ohashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement system and method for setting observation conditions of...
- Patent number 11,380,518
- Issue date Jul 5, 2022
- Hitachi, Ltd.
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device
- Patent number 11,276,551
- Issue date Mar 15, 2022
- Hitachi, Ltd.
- Atsuko Shintani
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PATTERN SHAPE EVALUATION DEVICE, PATTERN SHAPE EVALUATION SYSTEM, A...
- Publication number 20220034653
- Publication date Feb 3, 2022
- Hitachi High-Tech Corporation
- Atsuko Shintani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement System and Method for Setting Observation Conditions of...
- Publication number 20210407763
- Publication date Dec 30, 2021
- Hitachi, Ltd
- Takafumi MIWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE
- Publication number 20200365364
- Publication date Nov 19, 2020
- Hitachi, Ltd
- Atsuko SHINTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD AND CHARGED PARTIC...
- Publication number 20200219243
- Publication date Jul 9, 2020
- Hitachi High-Technologies Corporation
- Takeyoshi OHASHI
- G06 - COMPUTING CALCULATING COUNTING