Atsunori Kiku

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray topography apparatus
- Patent number 9,658,174
- Issue date May 23, 2017
- Rigaku Corporation
- Kazuhiko Omote
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray thin film inspection apparatus and thin film inspection appar...
- Patent number 7,258,485
- Issue date Aug 21, 2007
- Rigaku Corporation
- Asao Nakano
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY TOPOGRAPHY APPARATUS
- Publication number 20150146858
- Publication date May 28, 2015
- Rigaku Corporation
- Kazuhiko OMOTE
- G01 - MEASURING TESTING
Information Patent Application
X-ray thin film inspection apparatus and thin film inspection appar...
- Publication number 20060088139
- Publication date Apr 27, 2006
- Rigaku Corporation
- Asao Nakano
- G01 - MEASURING TESTING