Atsuo Fushida

Person

Kokubunji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 8,835,327
- Issue date Sep 16, 2014
- Fujitsu Limited
- Masanori Terahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect source analysis method, defect source analysis apparatus, an...
- Patent number 8,073,241
- Issue date Dec 6, 2011
- Fujitsu Semiconductor Limited
- Atsuo Fushida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacture of semiconductor device with salicide electrode
- Patent number 6,197,646
- Issue date Mar 6, 2001
- Fujitsu Limited
- Kenichi Goto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 6,008,111
- Issue date Dec 28, 1999
- Fujitsu Limited
- Atsuo Fushida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a semiconductor device having a silicide local int...
- Patent number 5,635,426
- Issue date Jun 3, 1997
- Fujitsu Limited
- Hiromi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor devices having silicide elect...
- Patent number 5,576,244
- Issue date Nov 19, 1996
- Fujitsu Limited
- Hiromi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor devices having silicide elect...
- Patent number 5,482,895
- Issue date Jan 9, 1996
- Fujitsu Limited
- Hiromi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20130244405
- Publication date Sep 19, 2013
- FUJITSU SEMICONDUCTOR LIMITED
- Masanori Terahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspecting method, inspecting apparatus, and method of manufacturin...
- Publication number 20070041631
- Publication date Feb 22, 2007
- FUJITSU LIMITED
- Atsuo Fushida
- H01 - BASIC ELECTRIC ELEMENTS

Atsuo Fushida

Person

Patents Grantslast 30 patents

Method of manufacturing semiconductor device

Defect source analysis method, defect source analysis apparatus, an...

Manufacture of semiconductor device with salicide electrode

Method of manufacturing semiconductor device

Method of making a semiconductor device having a silicide local int...

Method of manufacturing semiconductor devices having silicide elect...

Method of manufacturing semiconductor devices having silicide elect...

Patents Applicationslast 30 patents

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

Inspecting method, inspecting apparatus, and method of manufacturin...