Atsuo Mangyo

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Memory circuit
- Patent number 7,237,175
- Issue date Jun 26, 2007
- Renesas Technology Corp.
- Makoto Hatakenaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit device with test data output nodes...
- Patent number 7,047,461
- Issue date May 16, 2006
- Renesas Technology Corp.
- Akira Yamazaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor circuit device capable of accurately testing embedded...
- Patent number 6,807,116
- Issue date Oct 19, 2004
- Renesas Technology Corp.
- Akira Yamazaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with power consumption reduced in non-d...
- Patent number 6,781,903
- Issue date Aug 24, 2004
- Renesas Technology Corp.
- Atsuo Mangyo
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of testing a semiconductor memory device
- Patent number 6,715,117
- Issue date Mar 30, 2004
- Renesas Technology Corp.
- Atsuo Mangyo
- G11 - INFORMATION STORAGE
Information Patent Grant
Clock synchronous memory embedded semiconductor integrated circuit...
- Patent number 5,991,232
- Issue date Nov 23, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Masashi Matsumura
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor memory device with power consumption reduced in non-d...
- Publication number 20040081009
- Publication date Apr 29, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Atsuo Mangyo
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor circuit device capable of accurately testing embedded...
- Publication number 20040013016
- Publication date Jan 22, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Akira Yamazaki
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20030116763
- Publication date Jun 26, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Akira Yamazaki
- G11 - INFORMATION STORAGE
Information Patent Application
Memory circuit
- Publication number 20030046632
- Publication date Mar 6, 2003
- Makoto Hatakenaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Integrated circuit facilitating its unit test
- Publication number 20020162060
- Publication date Oct 31, 2002
- Makoto Hatakenaka
- G01 - MEASURING TESTING
Information Patent Application
Method of testing a semiconductor memory device
- Publication number 20020048856
- Publication date Apr 25, 2002
- Atsuo Mangyo
- G11 - INFORMATION STORAGE