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Atsuo Takatori
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Kawasaki, JP
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Patents Grants
last 30 patents
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Patent Grant
Delay fault test quality calculation apparatus, delay fault test qu...
Patent number
8,185,863
Issue date
May 22, 2012
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Delay fault test quality calculation apparatus, delay fault test qu...
Patent number
8,051,403
Issue date
Nov 1, 2011
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Logic circuit having gated clock buffer
Patent number
7,952,390
Issue date
May 31, 2011
Fujitsu Semiconductor Limited
Atsuo Takatori
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DELAY FAULT TEST QUALITY CALCULATION APPARATUS, DELAY FAULT TEST QU...
Publication number
20120016619
Publication date
Jan 19, 2012
FUJITSU SEMICONDUCTOR LIMITED
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Logic circuit having gated clock buffer
Publication number
20090273383
Publication date
Nov 5, 2009
FUJITSU MICROELECTRONICS LIMITED
Atsuo Takatori
G01 - MEASURING TESTING
Information
Patent Application
DELAY FAULT TEST QUALITY CALCULATION APPARATUS, DELAY FAULT TEST QU...
Publication number
20080120585
Publication date
May 22, 2008
Kabushiki Kaisha Toshiba
Yasuyuki Nozuyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Circuit quality evaluation method and apparatus, circuit quality ev...
Publication number
20050182587
Publication date
Aug 18, 2005
Semiconductor Technology Academic Research Center
Yasuo Sato
G01 - MEASURING TESTING