Atsushi Ieki

Person

Aichi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical encoder
- Patent number 9,448,089
- Issue date Sep 20, 2016
- OKUMA Corporation
- Yasukazu Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical grating and encoder
- Patent number 6,094,307
- Issue date Jul 25, 2000
- Okuma Corporation
- Atsushi Ieki
- G02 - OPTICS
Information Patent Grant
Optical encoder for detecting relative displacement based on signal...
- Patent number 5,981,942
- Issue date Nov 9, 1999
- Okuma Corporation
- Atsushi Ieki
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder diffraction gratings for eliminating diffracted lig...
- Patent number 5,801,378
- Issue date Sep 1, 1998
- Okuma Corporation
- Kazuhiro Hane
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder used for position detection based upon a plurality...
- Patent number 5,750,984
- Issue date May 12, 1998
- Okuma Corporation
- Atsushi Ieki
- G01 - MEASURING TESTING
Information Patent Grant
Scale and encoder including differently spaced pattern lines
- Patent number 5,748,373
- Issue date May 5, 1998
- Okuma Corporation
- Kazuhiro Hane
- G01 - MEASURING TESTING
Information Patent Grant
Position detecting apparatus of optical interferometry
- Patent number 5,737,069
- Issue date Apr 7, 1998
- Okuma Corporation
- Masayuki Nashiki
- G01 - MEASURING TESTING
Information Patent Grant
Absolute position detector with diffraction grating windows and spo...
- Patent number 5,260,568
- Issue date Nov 9, 1993
- Okuma Corporation
- Atsushi Ieki
- G01 - MEASURING TESTING
Information Patent Grant
Position detector
- Patent number 5,260,769
- Issue date Nov 9, 1993
- Okuma Corporation
- Atsushi Ieki
- G01 - MEASURING TESTING
Information Patent Grant
Position detecting apparatus generating periodic detection signals...
- Patent number 5,182,613
- Issue date Jan 26, 1993
- Okuma Corporation
- Atsushi Ieki
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder
- Patent number 5,177,356
- Issue date Jan 5, 1993
- Okuma Corp.
- Kenji Matsui
- G01 - MEASURING TESTING
Information Patent Grant
Parallel light ray measuring apparatus
- Patent number 5,170,221
- Issue date Dec 8, 1992
- Okuma Corp.
- Keiji Matsui
- G01 - MEASURING TESTING
Information Patent Grant
Optical encoder
- Patent number 5,068,530
- Issue date Nov 26, 1991
- Kabushiki Kaisha Okuma Tekkosho
- Atsushi Ieki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL ENCODER
- Publication number 20150115141
- Publication date Apr 30, 2015
- OKUMA CORPORATION
- Yasukazu Hayashi
- G01 - MEASURING TESTING

Atsushi Ieki

Person

Patents Grantslast 30 patents

Optical encoder

Optical grating and encoder

Optical encoder for detecting relative displacement based on signal...

Optical encoder diffraction gratings for eliminating diffracted lig...

Optical encoder used for position detection based upon a plurality...

Scale and encoder including differently spaced pattern lines

Position detecting apparatus of optical interferometry

Absolute position detector with diffraction grating windows and spo...

Position detector

Position detecting apparatus generating periodic detection signals...

Optical encoder

Parallel light ray measuring apparatus

Optical encoder

Patents Applicationslast 30 patents

OPTICAL ENCODER