Atsushi Igarashi

Person

Chiba, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Magnetic sensor and magnetic detection method
- Patent number 11,340,318
- Issue date May 24, 2022
- ABLIC INC.
- Hirotaka Uemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage abnormality detection circuit and semiconductor device
- Patent number 10,564,205
- Issue date Feb 18, 2020
- ABLIC INC.
- Atsushi Igarashi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Current generation circuit
- Patent number 10,503,197
- Issue date Dec 10, 2019
- ABLIC INC.
- Masakazu Sugiura
- G05 - CONTROLLING REGULATING
Information Patent Grant
Secondary battery monitoring device and method for diagnosing failure
- Patent number 10,288,694
- Issue date May 14, 2019
- ABLIC INC.
- Yasuhiro Miyamoto
- G01 - MEASURING TESTING
Information Patent Grant
Overheat detection circuit and semiconductor device
- Patent number 9,983,067
- Issue date May 29, 2018
- ABLIC INC.
- Masakazu Sugiura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection circuit
- Patent number 9,772,365
- Issue date Sep 26, 2017
- SII Semiconductor Corporation
- Masakazu Sugiura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Current detection circuit
- Patent number 9,733,284
- Issue date Aug 15, 2017
- SII Semiconductor Corporation
- Atsushi Igarashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Power supply voltage monitoring circuit, and electronic circuit inc...
- Patent number 9,454,174
- Issue date Sep 27, 2016
- SII SEMICONDUCTOR CORPORATION
- Atsushi Igarashi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Output circuit, temperature switch IC, and battery pack
- Patent number 9,118,326
- Issue date Aug 25, 2015
- Seiko Instruments Inc.
- Masahiro Mitani
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Power supply switching circuit
- Patent number 9,059,699
- Issue date Jun 16, 2015
- Seiko Instruments Inc.
- Tsutomu Tomioka
- G05 - CONTROLLING REGULATING
Information Patent Grant
Level shift circuit
- Patent number 9,030,249
- Issue date May 12, 2015
- Seiko Instruments Inc.
- Kosuke Takada
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Power supply voltage monitoring circuit and electronic circuit incl...
- Patent number 8,604,821
- Issue date Dec 10, 2013
- Seiko Instruments Inc.
- Masakazu Sugiura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Temperature sensor device
- Patent number 8,547,163
- Issue date Oct 1, 2013
- Seiko Instruments Inc.
- Masakazu Sugiura
- G01 - MEASURING TESTING
Information Patent Grant
Temperature detection device
- Patent number 8,531,234
- Issue date Sep 10, 2013
- Seiko Instruments Inc.
- Masakazu Sugiura
- G01 - MEASURING TESTING
Information Patent Grant
Constant current circuit and reference voltage circuit
- Patent number 8,476,967
- Issue date Jul 2, 2013
- Seiko Instruments Inc.
- Yuji Kobayashi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Temperature detection system
- Patent number 8,449,179
- Issue date May 28, 2013
- Seiko Instruments Inc.
- Atsushi Igarashi
- G01 - MEASURING TESTING
Information Patent Grant
Overheat protection circuit and power supply integrated circuit
- Patent number 8,451,571
- Issue date May 28, 2013
- Seiko Instruments Inc.
- Takashi Imura
- G05 - CONTROLLING REGULATING
Information Patent Grant
Differential amplifier circuit
- Patent number 8,264,277
- Issue date Sep 11, 2012
- Seiko Instruments Inc.
- Atsushi Igarashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Detection circuit and sensor device
- Patent number 8,183,907
- Issue date May 22, 2012
- Seiko Instruments Inc.
- Masakazu Sugiura
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Delay circuit including first and second internal delay circuits an...
- Patent number 8,063,675
- Issue date Nov 22, 2011
- Seiko Instruments Inc.
- Atsushi Igarashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Temperature sensor circuit
- Patent number 7,997,794
- Issue date Aug 16, 2011
- Seiko Instruments Inc.
- Atsushi Igarashi
- G01 - MEASURING TESTING
Information Patent Grant
Temperature detection circuit
- Patent number 7,977,999
- Issue date Jul 12, 2011
- Seiko Instruments Inc.
- Atsushi Igarashi
- G01 - MEASURING TESTING
Information Patent Grant
Temperature detection circuit
- Patent number 7,880,528
- Issue date Feb 1, 2011
- Seiko Instruments Inc.
- Atsushi Igarashi
- G01 - MEASURING TESTING
Information Patent Grant
Temperature detection circuit
- Patent number 7,795,950
- Issue date Sep 14, 2010
- Seiko Instruments Inc.
- Atsushi Igarashi
- G01 - MEASURING TESTING
Information Patent Grant
Amplifier circuit
- Patent number 7,508,258
- Issue date Mar 24, 2009
- Seiko Instruments Inc.
- Hirokazu Yoshizawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Chopper amplifier circuit and semiconductor device
- Patent number 7,479,826
- Issue date Jan 20, 2009
- Seiko Instruments Inc.
- Hirokazu Yoshizawa
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
MAGNETIC SENSOR AND MAGNETIC DETECTION METHOD
- Publication number 20210270915
- Publication date Sep 2, 2021
- ABLIC Inc.
- Hirotaka UEMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CURRENT GENERATION CIRCUIT
- Publication number 20190187739
- Publication date Jun 20, 2019
- ABLIC Inc.
- Masakazu SUGIURA
- G05 - CONTROLLING REGULATING
Information Patent Application
SECONDARY BATTERY MONITORING DEVICE AND METHOD FOR DIAGNOSING FAILURE
- Publication number 20180172771
- Publication date Jun 21, 2018
- SII Semiconductor Corporation
- Yasuhiro MIYAMOTO
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE ABNORMALITY DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20180172749
- Publication date Jun 21, 2018
- SII Semiconductor Corporation
- Atsushi IGARASHI
- G05 - CONTROLLING REGULATING
Information Patent Application
CURRENT DETECTION CIRCUIT
- Publication number 20160305985
- Publication date Oct 20, 2016
- SII Semiconductor Corporation
- Atsushi IGARASHI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION CIRCUIT
- Publication number 20160216307
- Publication date Jul 28, 2016
- SEIKO INSTRUMENTS INC.
- Masakazu SUGIURA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20160064916
- Publication date Mar 3, 2016
- SEIKO INSTRUMENTS INC.
- Masakazu SUGIURA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
OVERHEAT DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20150308902
- Publication date Oct 29, 2015
- SEIKO INSTRUMENTS INC.
- Masakazu SUGIURA
- G01 - MEASURING TESTING
Information Patent Application
POWER SUPPLY VOLTAGE MONITORING CIRCUIT, AND ELECTRONIC CIRCUIT INC...
- Publication number 20150309528
- Publication date Oct 29, 2015
- SEIKO INSTRUMENTS INC.
- Atsushi IGARASHI
- G05 - CONTROLLING REGULATING
Information Patent Application
LEVEL SHIFT CIRCUIT
- Publication number 20140232447
- Publication date Aug 21, 2014
- SEIKO INSTRUMENTS INC.
- Kosuke TAKADA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
POWER SUPPLY SWITCHING CIRCUIT
- Publication number 20140084878
- Publication date Mar 27, 2014
- SEIKO INSTRUMENTS INC.
- Tsutomu TOMIOKA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
OUTPUT CIRCUIT, TEMPERATURE SWITCH IC, AND BATTERY PACK
- Publication number 20120187911
- Publication date Jul 26, 2012
- Masahiro Mitani
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEMPERATURE SENSOR DEVICE
- Publication number 20120182062
- Publication date Jul 19, 2012
- Masakazu Sugiura
- G01 - MEASURING TESTING
Information Patent Application
TEST MODE SETTING CIRCUIT
- Publication number 20120131402
- Publication date May 24, 2012
- Masakazu Sugiura
- G01 - MEASURING TESTING
Information Patent Application
CONSTANT CURRENT CIRCUIT AND REFERENCE VOLTAGE CIRCUIT
- Publication number 20120126873
- Publication date May 24, 2012
- Yuji Kobayashi
- G05 - CONTROLLING REGULATING
Information Patent Application
TEMPERATURE DETECTION DEVICE
- Publication number 20120105132
- Publication date May 3, 2012
- Masakazu Sugiura
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL AMPLIFIER CIRCUIT
- Publication number 20110273232
- Publication date Nov 10, 2011
- Atsushi Igarashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEMPERATURE DETECTION SYSTEM
- Publication number 20110158285
- Publication date Jun 30, 2011
- Atsushi Igarashi
- G01 - MEASURING TESTING
Information Patent Application
OVERHEAT PROTECTION CIRCUIT AND POWER SUPPLY INTEGRATED CIRCUIT
- Publication number 20100321845
- Publication date Dec 23, 2010
- Takashi Imura
- G05 - CONTROLLING REGULATING
Information Patent Application
POWER SUPPLY VOLTAGE MONITORING CIRCUIT AND ELECTRONIC CIRCUIT INCL...
- Publication number 20100176839
- Publication date Jul 15, 2010
- Masakazu Sugiura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DELAY CIRCUIT
- Publication number 20100176854
- Publication date Jul 15, 2010
- Atsushi Igarashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DETECTION CIRCUIT AND SENSOR DEVICE
- Publication number 20100180059
- Publication date Jul 15, 2010
- Masakazu Sugiura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE DETECTION CIRCUIT
- Publication number 20100176874
- Publication date Jul 15, 2010
- Masakazu Sugiura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Temperature detection circuit
- Publication number 20100156507
- Publication date Jun 24, 2010
- Atsushi Igarashi
- G01 - MEASURING TESTING
Information Patent Application
Temperature detection circuit
- Publication number 20090206912
- Publication date Aug 20, 2009
- Atsushi Igarashi
- G01 - MEASURING TESTING
Information Patent Application
Temperature Sensor Circuit
- Publication number 20080285624
- Publication date Nov 20, 2008
- Atsushi Igarashi
- G01 - MEASURING TESTING
Information Patent Application
Temperature detection circuit
- Publication number 20080198899
- Publication date Aug 21, 2008
- Atsushi Igarashi
- G01 - MEASURING TESTING
Information Patent Application
Amplifier circuit
- Publication number 20070222509
- Publication date Sep 27, 2007
- Hirokazu Yoshizawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Chopper amplifier circuit and semiconductor device
- Publication number 20070146065
- Publication date Jun 28, 2007
- Hirokazu Yoshizawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Lateral trench MOSFET
- Publication number 20060001110
- Publication date Jan 5, 2006
- Atsushi Igarashi
- H01 - BASIC ELECTRIC ELEMENTS

Atsushi Igarashi

Person

Patents Grantslast 30 patents

Magnetic sensor and magnetic detection method

Voltage abnormality detection circuit and semiconductor device

Current generation circuit

Secondary battery monitoring device and method for diagnosing failure

Overheat detection circuit and semiconductor device

Detection circuit

Current detection circuit

Power supply voltage monitoring circuit, and electronic circuit inc...

Output circuit, temperature switch IC, and battery pack

Power supply switching circuit

Level shift circuit

Power supply voltage monitoring circuit and electronic circuit incl...

Temperature sensor device

Temperature detection device

Constant current circuit and reference voltage circuit

Temperature detection system

Overheat protection circuit and power supply integrated circuit

Differential amplifier circuit

Detection circuit and sensor device

Delay circuit including first and second internal delay circuits an...

Temperature sensor circuit

Temperature detection circuit

Temperature detection circuit

Temperature detection circuit

Amplifier circuit

Chopper amplifier circuit and semiconductor device

Patents Applicationslast 30 patents

MAGNETIC SENSOR AND MAGNETIC DETECTION METHOD

CURRENT GENERATION CIRCUIT

SECONDARY BATTERY MONITORING DEVICE AND METHOD FOR DIAGNOSING FAILURE

VOLTAGE ABNORMALITY DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE

CURRENT DETECTION CIRCUIT

DETECTION CIRCUIT

DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE

OVERHEAT DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE

POWER SUPPLY VOLTAGE MONITORING CIRCUIT, AND ELECTRONIC CIRCUIT INC...

LEVEL SHIFT CIRCUIT

POWER SUPPLY SWITCHING CIRCUIT

OUTPUT CIRCUIT, TEMPERATURE SWITCH IC, AND BATTERY PACK

TEMPERATURE SENSOR DEVICE

TEST MODE SETTING CIRCUIT

CONSTANT CURRENT CIRCUIT AND REFERENCE VOLTAGE CIRCUIT

TEMPERATURE DETECTION DEVICE

DIFFERENTIAL AMPLIFIER CIRCUIT

TEMPERATURE DETECTION SYSTEM

OVERHEAT PROTECTION CIRCUIT AND POWER SUPPLY INTEGRATED CIRCUIT

POWER SUPPLY VOLTAGE MONITORING CIRCUIT AND ELECTRONIC CIRCUIT INCL...

DELAY CIRCUIT

DETECTION CIRCUIT AND SENSOR DEVICE

VOLTAGE DETECTION CIRCUIT

Temperature detection circuit

Temperature detection circuit

Temperature Sensor Circuit

Temperature detection circuit

Amplifier circuit

Chopper amplifier circuit and semiconductor device

Lateral trench MOSFET