Atsushi Iwai

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Shiga, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection device
- Patent number 10,859,514
- Issue date Dec 8, 2020
- ISHIDA CO., LTD.
- Atsushi Iwai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray examination device
- Patent number 10,788,436
- Issue date Sep 29, 2020
- ISHIDA CO., LTD.
- Yoshinori Tarumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray generator and X-ray inspection apparatus
- Patent number 10,098,216
- Issue date Oct 9, 2018
- ISHIDA CO., LTD.
- Takashi Kabumoto
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray inspection apparatus and X-ray inspection program
- Patent number 7,980,760
- Issue date Jul 19, 2011
- ISHIDA CO., LTD.
- Takashi Kabumoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS
- Publication number 20210004951
- Publication date Jan 7, 2021
- ISHIDA CO., LTD.
- Atsushi IWAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY EXAMINATION DEVICE
- Publication number 20180321167
- Publication date Nov 8, 2018
- Ishida Co., Ltd.
- Yoshinori TARUMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS
- Publication number 20180242440
- Publication date Aug 23, 2018
- Ishida Co., Ltd.
- Takashi KABUMOTO
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20180027640
- Publication date Jan 25, 2018
- Ishida Co., Ltd.
- Atsushi IWAI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION PROGRAM
- Publication number 20100002835
- Publication date Jan 7, 2010
- ISHIDA CO., LTD.
- Takashi Kabumoto
- G01 - MEASURING TESTING