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Atsushi Iwai
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Shiga, JP
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Patents Grants
last 30 patents
Information
Patent Grant
X-ray inspection device
Patent number
10,859,514
Issue date
Dec 8, 2020
ISHIDA CO., LTD.
Atsushi Iwai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray examination device
Patent number
10,788,436
Issue date
Sep 29, 2020
ISHIDA CO., LTD.
Yoshinori Tarumoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray generator and X-ray inspection apparatus
Patent number
10,098,216
Issue date
Oct 9, 2018
ISHIDA CO., LTD.
Takashi Kabumoto
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
X-ray inspection apparatus and X-ray inspection program
Patent number
7,980,760
Issue date
Jul 19, 2011
ISHIDA CO., LTD.
Takashi Kabumoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER
Publication number
20250108576
Publication date
Apr 3, 2025
The Yokohama Rubber Co., LTD.
Mitsuo TSUJI
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS
Publication number
20210004951
Publication date
Jan 7, 2021
ISHIDA CO., LTD.
Atsushi IWAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY EXAMINATION DEVICE
Publication number
20180321167
Publication date
Nov 8, 2018
Ishida Co., Ltd.
Yoshinori TARUMOTO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS
Publication number
20180242440
Publication date
Aug 23, 2018
Ishida Co., Ltd.
Takashi KABUMOTO
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
X-RAY INSPECTION DEVICE
Publication number
20180027640
Publication date
Jan 25, 2018
Ishida Co., Ltd.
Atsushi IWAI
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION PROGRAM
Publication number
20100002835
Publication date
Jan 7, 2010
ISHIDA CO., LTD.
Takashi Kabumoto
G01 - MEASURING TESTING