Atsushi Kawabe

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit having self-diagnosis test functio...
- Patent number 6,832,348
- Issue date Dec 14, 2004
- Matsushita Electric Industrial Co., Ltd.
- Atsushi Kawabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit having self-diagnosis test functio...
- Publication number 20010003196
- Publication date Jun 7, 2001
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Atsushi Kawabe
- G01 - MEASURING TESTING