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Atsushi Mark Takahashi
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Menlo Park, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Reduction of slice select artifacts in half pulse excitations used...
Patent number
8,723,517
Issue date
May 13, 2014
General Electric Company
Atsushi Mark Takahashi
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus of directly measuring cross-axis eddy currents...
Patent number
7,323,872
Issue date
Jan 29, 2008
General Electric Company
Atsushi Mark Takahashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
REDUCTION OF SLICE SELECT ARTIFACTS IN HALF PULSE EXCITATIONS USED...
Publication number
20120019243
Publication date
Jan 26, 2012
GENERAL ELECTRIC COMPANY
Atsushi Mark Takahashi
G01 - MEASURING TESTING