Membership
Tour
Register
Log in
Atsushi Nakanishi
Follow
Person
Hamamatsu-shi, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Optical element
Patent number
11,372,256
Issue date
Jun 28, 2022
Hamamatsu Photonics K.K.
Atsushi Nakanishi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Polymer resin orientation evaluation method
Patent number
11,371,935
Issue date
Jun 28, 2022
Hamamatsu Photonics K.K.
Atsushi Nakanishi
G01 - MEASURING TESTING
Information
Patent Grant
Optical component for terahertz waves
Patent number
10,935,488
Issue date
Mar 2, 2021
Hamamatsu Photonics K.K.
Atsushi Nakanishi
G01 - MEASURING TESTING
Information
Patent Grant
Wave plate and divided prism member
Patent number
10,908,355
Issue date
Feb 2, 2021
HAMAMATSU PHOTONICS K.K.
Yoichi Kawada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Terahertz wave spectroscopic measurement apparatus and terahertz wa...
Patent number
10,895,504
Issue date
Jan 19, 2021
Hamamatsu Photonics K.K.
Takashi Yasuda
G01 - MEASURING TESTING
Information
Patent Grant
Optical structure
Patent number
10,823,976
Issue date
Nov 3, 2020
Hamamatsu Photonics K.K.
Atsushi Nakanishi
G02 - OPTICS
Information
Patent Grant
Optical measurement device and optical measurement method
Patent number
10,809,189
Issue date
Oct 20, 2020
Hamamatsu Photonics K.K.
Kazuki Horita
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz wave spectroscopic measurement device
Patent number
10,697,891
Issue date
Jun 30, 2020
Hamamatsu Photonics K.K.
Atsushi Nakanishi
G01 - MEASURING TESTING
Information
Patent Grant
Optical structure
Patent number
10,627,645
Issue date
Apr 21, 2020
Hamamatsu Photonics K.K.
Atsushi Nakanishi
G02 - OPTICS
Information
Patent Grant
Wave plate and divided prism member
Patent number
10,591,669
Issue date
Mar 17, 2020
Hamamatsu Photonics K.K.
Yoichi Kawada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Non-linear optical crystal and method for manufacturing same, and t...
Patent number
10,248,003
Issue date
Apr 2, 2019
Hamamatsu Photonics K.K.
Kouichiro Akiyama
C07 - ORGANIC CHEMISTRY
Information
Patent Grant
Terahertz-wave spectrometer
Patent number
9,696,206
Issue date
Jul 4, 2017
Hamamatsu Photonics K.K.
Takashi Yasuda
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz wave temporal waveform acquistion apparatus
Patent number
9,417,183
Issue date
Aug 16, 2016
Hamamatsu Photonics K.K.
Atsushi Nakanishi
G01 - MEASURING TESTING
Information
Patent Grant
Prism member, terahertz-wave spectroscopic measurement device, and...
Patent number
9,417,182
Issue date
Aug 16, 2016
Hamamatsu Photonics K.K.
Kouichiro Akiyama
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz-wave spectrometer and prism member
Patent number
9,080,913
Issue date
Jul 14, 2015
Hamamatsu Photonics K.K.
Takashi Yasuda
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz wave generation device
Patent number
8,564,875
Issue date
Oct 22, 2013
Hamamatsu Photonics K.K.
Yoichi Kawada
G02 - OPTICS
Information
Patent Grant
Total reflection terahertz wave measurement device
Patent number
8,415,625
Issue date
Apr 9, 2013
Hamamatsu Photonics K.K.
Atsushi Nakanishi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF MANUFACTURING RESIN MEMBER, AND RESIN MEMBER
Publication number
20240218140
Publication date
Jul 4, 2024
HAMAMATSU PHOTONICS K. K.
Atsushi NAKANISHI
C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information
Patent Application
GRAPHENE MANUFACTURING METHOD
Publication number
20240208822
Publication date
Jun 27, 2024
HAMAMATSU PHOTONICS K. K.
Atsushi NAKANISHI
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
LASER MODULE
Publication number
20230318255
Publication date
Oct 5, 2023
HAMAMATSU PHOTONICS K. K.
Shohei HAYASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LASER MODULE
Publication number
20220209505
Publication date
Jun 30, 2022
Hamamatsu Photonics K.K.
Kazuue FUJITA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
POLYMER RESIN ORIENTATION EVALUATION METHOD
Publication number
20210010934
Publication date
Jan 14, 2021
HAMAMATSU PHOTONICS K. K.
Atsushi NAKANISHI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ELEMENT
Publication number
20200249488
Publication date
Aug 6, 2020
HAMAMATSU PHOTONICS K. K.
Atsushi NAKANISHI
G02 - OPTICS
Information
Patent Application
WAVE PLATE AND DIVIDED PRISM MEMBER
Publication number
20200150339
Publication date
May 14, 2020
HAMAMATSU PHOTONICS K. K.
Yoichi KAWADA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL COMPONENT FOR TERAHERTZ WAVES
Publication number
20190360926
Publication date
Nov 28, 2019
HAMAMATSU PHOTONICS K. K.
Atsushi NAKANISHI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
Publication number
20190271642
Publication date
Sep 5, 2019
HAMAMATSU PHOTONICS K. K.
Kazuki HORITA
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ WAVE SPECTROSCOPIC MEASUREMENT DEVICE
Publication number
20190234871
Publication date
Aug 1, 2019
HAMAMATSU PHOTONICS K. K.
Atsushi NAKANISHI
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ WAVE SPECTROSCOPIC MEASUREMENT APPARATUS AND TERAHERTZ WA...
Publication number
20190025124
Publication date
Jan 24, 2019
HAMAMATSU PHOTONICS K. K.
Takashi YASUDA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL STRUCTURE
Publication number
20180196276
Publication date
Jul 12, 2018
HAMAMATSU PHOTONICS K. K.
Atsushi NAKANISHI
G02 - OPTICS
Information
Patent Application
OPTICAL STRUCTURE
Publication number
20180164601
Publication date
Jun 14, 2018
HAMAMATSU PHOTONICS K. K.
Atsushi NAKANISHI
G02 - OPTICS
Information
Patent Application
NON-LINEAR OPTICAL CRYSTAL AND METHOD FOR MANUFACTURING SAME, AND T...
Publication number
20170248833
Publication date
Aug 31, 2017
Hamamatsu Photonics K.K.
Kouichiro Akiyama
G02 - OPTICS
Information
Patent Application
TERAHERTZ WAVE TEMPORAL WAVEFORM ACQUISTION APPARATUS
Publication number
20160202179
Publication date
Jul 14, 2016
HAMAMATSU PHOTONICS K. K.
Atsushi NAKANISHI
G01 - MEASURING TESTING
Information
Patent Application
WAVE PLATE AND DIVIDED PRISM MEMBER
Publication number
20160154176
Publication date
Jun 2, 2016
Hamamatsu Photonics K. K.
Yoichi KAWADA
G02 - OPTICS
Information
Patent Application
PRISM MEMBER, TERAHERTZ-WAVE SPECTROSCOPIC MEASUREMENT DEVICE, AND...
Publication number
20150136986
Publication date
May 21, 2015
Hamamatsu Photonics K.K.
Kouichiro Akiyama
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ-WAVE SPECTROMETER
Publication number
20140014840
Publication date
Jan 16, 2014
Hamamatsu Photonics K.K.
Takashi Yasuda
G01 - MEASURING TESTING
Information
Patent Application
TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD
Publication number
20140008541
Publication date
Jan 9, 2014
Hamamatsu Photonics K.K.
Kouichiro Akiyama
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ-WAVE SPECTROMETER AND PRISM MEMBER
Publication number
20140008540
Publication date
Jan 9, 2014
Hamamatsu Photonics K.K.
Takashi Yasuda
G01 - MEASURING TESTING
Information
Patent Application
TOTAL REFLECTION TERAHERTZ WAVE MEASUREMENT DEVICE
Publication number
20110249253
Publication date
Oct 13, 2011
HAMAMATSU PHOTONICS K. K.
Atsushi Nakanishi
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ WAVE GENERATION DEVICE
Publication number
20110242642
Publication date
Oct 6, 2011
HAMAMATSU PHOTONICS K. K.
Yoichi Kawada
G02 - OPTICS