Atsushi Ohtake

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometric analysis method and system using the method
- Patent number 7,435,949
- Issue date Oct 14, 2008
- Hitachi High-Technologies Corporation
- Atsushi Ohtake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry and mass spectrometry system
- Patent number 7,180,056
- Issue date Feb 20, 2007
- Hitachi, Ltd.
- Atsushi Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for assessing surface uniformity of semiconductor...
- Patent number 6,806,098
- Issue date Oct 19, 2004
- Hitachi, Ltd.
- Atsushi Ohtake
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
Resin Composition for Electric Insulation and Its Hardened Products...
- Publication number 20150069877
- Publication date Mar 12, 2015
- Mitsubishi Hitachi Power Systems, Ltd.
- Takuya OTOWA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Mass spectrometric analysis method and system using the method
- Publication number 20060289735
- Publication date Dec 28, 2006
- Atsushi Ohtake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for managing programs for web service system
- Publication number 20050172034
- Publication date Aug 4, 2005
- Hitachi, Ltd
- Nobuyoshi Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and device for inspecting surface of semiconductor device
- Publication number 20030207576
- Publication date Nov 6, 2003
- Hitachi, Ltd.
- Atsushi Ohtake
- B24 - GRINDING POLISHING