Atsushi ONO

Person

  • Hamamatsu-shi, Shizuoka, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Refractive index measuring device

    • Patent number 10,168,277
    • Issue date Jan 1, 2019
    • National University Corporation Shizuoka University
    • Hiroshi Inokawa
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents