Atsushi Takizawa

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Calibration plate having accurately defined calibration pattern
- Patent number 6,757,629
- Issue date Jun 29, 2004
- Fujitsu Limited
- Atsushi Takizawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern exposure method and system
- Patent number 6,124,598
- Issue date Sep 26, 2000
- Fujitsu Limited
- Atsushi Takizawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Reticle, semiconductor wafer, and semiconductor chip
- Patent number 6,097,102
- Issue date Aug 1, 2000
- Fujitsu Limited
- Atsushi Takizawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reticle semiconductor wafer, and semiconductor chip
- Patent number 5,929,529
- Issue date Jul 27, 1999
- Fujitsu Limited
- Atsushi Takizawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Calibration plate having accurately defined calibration pattern
- Publication number 20020082789
- Publication date Jun 27, 2002
- FUJITSU LIMITED
- Atsushi Takizawa
- H01 - BASIC ELECTRIC ELEMENTS