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Atsushi Taniguchi
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Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Terminal and communication system
Patent number
12,170,547
Issue date
Dec 17, 2024
Nippon Telegraph and Telephone Corporation
Riichi Kudo
G08 - SIGNALLING
Information
Patent Grant
Techniques for generating network topologies that accommodate diffe...
Patent number
12,143,273
Issue date
Nov 12, 2024
Nippon Telegraph and Telephone Corporation
Kazuya Anazawa
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Communication device and communication system
Patent number
12,133,114
Issue date
Oct 29, 2024
Nippon Telegraph and Telephone Corporation
Riichi Kudo
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Communication system and base station
Patent number
12,028,788
Issue date
Jul 2, 2024
Nippon Telegraph and Telephone Corporation
Riichi Kudo
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Network setting device, method and program
Patent number
11,902,154
Issue date
Feb 13, 2024
Nippon Telegraph and Telephone Corporation
Takeru Inoue
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Base station management method, base station management apparatus a...
Patent number
11,877,199
Issue date
Jan 16, 2024
Nippon Telegraph and Telephone Corporation
Takashi Shimizu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Reliability estimation system and reliability estimation method
Patent number
11,722,397
Issue date
Aug 8, 2023
Nippon Telegraph and Telephone Corporation
Atsushi Taniguchi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Distance measuring device, distance measuring method, and three-dim...
Patent number
11,644,545
Issue date
May 9, 2023
Hitachi, Ltd.
Kenji Maruno
G02 - OPTICS
Information
Patent Grant
Shape measuring system and shape measuring method
Patent number
11,635,295
Issue date
Apr 25, 2023
Hitachi, Ltd.
Tatsuo Hariyama
G01 - MEASURING TESTING
Information
Patent Grant
Communication control device, communication control method and comm...
Patent number
11,617,070
Issue date
Mar 28, 2023
Nippon Telegraph and Telephone Corporation
Atsushi Taniguchi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Wireless communication method, control device, terminal and wireles...
Patent number
11,546,868
Issue date
Jan 3, 2023
Nippon Telegraph and Telephone Corporation
Yohei Katayama
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Wireless communication method, wireless communication device and wi...
Patent number
11,438,890
Issue date
Sep 6, 2022
Nippon Telegraph and Telephone Corporation
Yohei Katayama
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Environment information acquisition method, environment information...
Patent number
11,432,179
Issue date
Aug 30, 2022
Nippon Telegraph and Telephone Corporation
Maiko Naya
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Shape measurement system, probe tip unit, and shape measurement method
Patent number
11,421,976
Issue date
Aug 23, 2022
Hitachi, Ltd.
Tatsuo Hariyama
G01 - MEASURING TESTING
Information
Patent Grant
Wireless communication method, control device and wireless communic...
Patent number
11,419,113
Issue date
Aug 16, 2022
Nippon Telegraph and Telephone Corporation
Yohei Katayama
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Access point management method, access point management apparatus,...
Patent number
11,412,445
Issue date
Aug 9, 2022
Nippon Telegraph and Telephone Corporation
Takahiro Yamazaki
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Wireless communication method, wireless communication system and ba...
Patent number
11,395,324
Issue date
Jul 19, 2022
Nippon Telegraph and Telephone Corporation
Yohei Katayama
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Shape measurement system, probe tip unit, and shape measurement method
Patent number
11,054,242
Issue date
Jul 6, 2021
Hitachi, Ltd.
Tatsuo Hariyama
G01 - MEASURING TESTING
Information
Patent Grant
Distance measuring device and three-dimensional shape measuring app...
Patent number
10,900,773
Issue date
Jan 26, 2021
Hitachi, Ltd.
Masahiro Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Shape measurement system and shape measurement method
Patent number
10,794,687
Issue date
Oct 6, 2020
Hitachi, Ltd.
Atsushi Taniguchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Audio signal output device and audio output system
Patent number
9,780,750
Issue date
Oct 3, 2017
Funai Electric Co., Ltd.
Yuichi Ito
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for inspecting defect
Patent number
9,535,013
Issue date
Jan 3, 2017
Hitachi High-Technologies Corporation
Shunichi Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Audio signal output device and audio output system
Patent number
9,490,763
Issue date
Nov 8, 2016
Funai Electric Co., Ltd.
Atsushi Taniguchi
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Defect inspection method and defect inspection device
Patent number
9,470,640
Issue date
Oct 18, 2016
Hitachi High-Technologies Corporation
Shunichi Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection method and defect inspection device
Patent number
9,291,574
Issue date
Mar 22, 2016
Hitachi High-Technologies Corporation
Shunichi Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection method and device thereof
Patent number
9,255,793
Issue date
Feb 9, 2016
Hitachi High-Technologies Corporation
Yukihiro Shibata
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection method and device therefor
Patent number
9,239,283
Issue date
Jan 19, 2016
Hitachi High-Technologies Corporation
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Grant
Optical filtering device, defect inspection method and apparatus th...
Patent number
9,182,592
Issue date
Nov 10, 2015
Hitachi, Ltd.
Taketo Ueno
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection device and defect inspection method
Patent number
9,019,492
Issue date
Apr 28, 2015
Hitachi High-Technologies Corporation
Atsushi Taniguchi
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspecting apparatus and defect inspecting method
Patent number
8,970,836
Issue date
Mar 3, 2015
Hitachi High-Technologies Corporation
Atsushi Taniguchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
QUANTUM KEY DISTRIBUTION SYSTEM, QUANTUM KEY DISTRIBUTION METHOD, A...
Publication number
20240372713
Publication date
Nov 7, 2024
Nippon Telegraph and Telephone Corporation
Atsushi TANIGUCHI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
NETWORK SETTING DEVICE, METHOD AND PROGRAM
Publication number
20230132633
Publication date
May 4, 2023
Nippon Telegraph and Telephone Corporation
Takeru INOUE
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
EXECUTION PROCEDURE SEARCH DEVICE, METHOD AND PROGRAM
Publication number
20230138720
Publication date
May 4, 2023
Nippon Telegraph and Telephone Corporation
Takeru INOUE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE, METHOD AND PROGRAM FOR GENERATING NETWORK TOPOLOGIES
Publication number
20230013105
Publication date
Jan 19, 2023
Nippon Telegraph and Telephone Corporation
Kazuya ANAZAWA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
COMMUNICATION SYSTEM AND TERMINAL
Publication number
20220352995
Publication date
Nov 3, 2022
Nippon Telegraph and Telephone Corporation
Riichi KUDO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RELIABILITY ESTIMATION SYSTEM AND RELIABILITY ESTIMATION METHOD
Publication number
20220321447
Publication date
Oct 6, 2022
Nippon Telegraph and Telephone Corporation
Atsushi TANIGUCHI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Distance Measurement System and Distance Measurement Method
Publication number
20220268929
Publication date
Aug 25, 2022
Hitachi, Ltd
Tatsuo HARIYAMA
G01 - MEASURING TESTING
Information
Patent Application
COMMUNICATION SYSTEM AND BASE STATION
Publication number
20220210622
Publication date
Jun 30, 2022
Nippon Telegraph and Telephone Corporation
Riichi KUDO
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
TERMINAL AND COMMUNICATION SYSTEM
Publication number
20220190941
Publication date
Jun 16, 2022
Nippon Telegraph and Telephone Corporation
Riichi KUDO
G08 - SIGNALLING
Information
Patent Application
Shape Measuring System and Shape Measuring Method
Publication number
20220178680
Publication date
Jun 9, 2022
Hitachi, Ltd
Tatsuo HARIYAMA
G01 - MEASURING TESTING
Information
Patent Application
COMMUNICATION DEVICE AND COMMUNICATION SYSTEM
Publication number
20220159512
Publication date
May 19, 2022
Nippon Telegraph and Telephone Corporation
Riichi KUDO
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SHAPE MEASUREMENT SYSTEM, PROBE TIP UNIT, AND SHAPE MEASUREMENT METHOD
Publication number
20210293524
Publication date
Sep 23, 2021
Hitachi, Ltd
Tatsuo HARIYAMA
G01 - MEASURING TESTING
Information
Patent Application
WIRELESS COMMUNICATION METHOD, CONTROL DEVICE, TERMINAL AND WIRELES...
Publication number
20210274456
Publication date
Sep 2, 2021
Nippon Telegraph and Telephone Corporation
Yohei KATAYAMA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
WIRELESS COMMUNICATION METHOD, CONTROL DEVICE AND WIRELESS COMMUNIC...
Publication number
20210227538
Publication date
Jul 22, 2021
Nippon Telegraph and Telephone Corporation
Yohei KATAYAMA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
BASE STATION MANAGEMENT METHOD, BASE STATION MANAGEMENT APPARATUS A...
Publication number
20210219201
Publication date
Jul 15, 2021
Nippon Telegraph and Telephone Corporation
Takashi SHIMIZU
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
WIRELESS COMMUNICATION METHOD, WIRELESS COMMUNICATION SYSTEM AND BA...
Publication number
20210160914
Publication date
May 27, 2021
Nippon Telegraph and Telephone Corporation
Yohei KATAYAMA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
WIRELESS COMMUNICATION METHOD, WIRELESS COMMUNICATION DEVICE AND WI...
Publication number
20210112549
Publication date
Apr 15, 2021
Nippon Telegraph and Telephone Corporation
Yohei KATAYAMA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
ENVIRONMENT INFORMATION ACQUISITION METHOD, ENVIRONMENT INFORMATION...
Publication number
20210092628
Publication date
Mar 25, 2021
Nippon Telegraph and Telephone Corporation
Maiko NAYA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
INDEX COMPUTATION DEVICE, PREDICTION SYSTEM, PROGRESS PREDICTION EV...
Publication number
20210042700
Publication date
Feb 11, 2021
NEC Solution Innovators, Ltd.
Hiroshi TAMANO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COMMUNICATION CONTROL DEVICE, COMMUNICATION CONTROL METHOD AND COMM...
Publication number
20210037371
Publication date
Feb 4, 2021
Nippon Telegraph and Telephone Corporation
Atsushi TANIGUCHI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
ACCESS POINT MANAGEMENT METHOD, ACCESS POINT MANAGEMENT APPARATUS,...
Publication number
20210029630
Publication date
Jan 28, 2021
Nippon Telegraph and Telephone Corporation
Takahiro YAMAZAKI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
PREDICTION SYSTEM, MODEL GENERATION SYSTEM, METHOD, AND PROGRAM
Publication number
20210012244
Publication date
Jan 14, 2021
NEC Solution Innovators, Ltd.
Atsushi TANIGUCHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SHAPE MEASUREMENT SYSTEM, PROBE TIP UNIT, AND SHAPE MEASUREMENT METHOD
Publication number
20200166327
Publication date
May 28, 2020
Hitachi, Ltd
Tatsuo HARIYAMA
G01 - MEASURING TESTING
Information
Patent Application
Distance Measuring Device and Three-Dimensional Shape Measuring App...
Publication number
20200041259
Publication date
Feb 6, 2020
Hitachi, Ltd
Masahiro WATANABE
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE MEASURING DEVICE, DISTANCE MEASURING METHOD, AND THREE-DIM...
Publication number
20200018823
Publication date
Jan 16, 2020
Hitachi, Ltd
Kenji MARUNO
G01 - MEASURING TESTING
Information
Patent Application
Shape Measurement System and Shape Measurement Method
Publication number
20180306573
Publication date
Oct 25, 2018
Hitachi, Ltd
Atsushi TANIGUCHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR MANUFACTURING COMPONENT AND MANUFACTURING APPARATUS USIN...
Publication number
20170205224
Publication date
Jul 20, 2017
Hitachi Automotive Systems, Ltd.
Atsushi TANIGUCHI
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE
Publication number
20160161422
Publication date
Jun 9, 2016
Hitachi High-Technologies Corporation
Shunichi MATSUMOTO
G01 - MEASURING TESTING
Information
Patent Application
SHAPE EXAMINATION METHOD AND DEVICE THEREFOR
Publication number
20150362310
Publication date
Dec 17, 2015
Hitachi, Ltd
Atsushi TANIGUCHI
G01 - MEASURING TESTING
Information
Patent Application
Audio Signal Output Device and Audio Output System
Publication number
20150043752
Publication date
Feb 12, 2015
Funai Electric Co., Ltd.
Yuichi Ito
H04 - ELECTRIC COMMUNICATION TECHNIQUE