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Atsushi Tomishima

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  • Nagareyama-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Semiconductor device
    • Patent number 12,362,339
    • Issue date Jul 15, 2025
    • Kabushiki Kaisha Toshiba
    • Kenichi Agawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Interchangeable FPGA-gate array
    • Patent number 6,615,402
    • Issue date Sep 2, 2003
    • Kabushiki Kaisha Toshiba
    • Yoshio Kaneko
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    NOISE MODEL GENERATING METHOD AND NOISE MODEL GENERATING DEVICE
    • Publication number 20250216434
    • Publication date Jul 3, 2025
    • Kabushiki Kaisha Toshiba
    • Hidetoshi MIYAHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20230089615
    • Publication date Mar 23, 2023
    • Kabushiki Kaisha Toshiba
    • Kenichi AGAWA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20110180898
    • Publication date Jul 28, 2011
    • Kabushiki Kaisha Toshiba
    • Atsushi Tomishima
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Interchangeable FPGA-Gate array
    • Publication number 20010027548
    • Publication date Oct 4, 2001
    • Yoshio Kaneko
    • G01 - MEASURING TESTING