Atsushi Uemoto

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic sample preparation apparatus
- Patent number 11,835,438
- Issue date Dec 5, 2023
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and control method thereof
- Patent number 11,742,177
- Issue date Aug 29, 2023
- Hitachi High-Tech Science Corporation
- Ayana Muraki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus
- Patent number 11,482,398
- Issue date Oct 25, 2022
- Hitachi High-Tech Science Corporation
- Haruyuki Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,476,078
- Issue date Oct 18, 2022
- Hitachi High-Tech Science Corporation
- Masahiro Kiyohara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,361,936
- Issue date Jun 14, 2022
- Hitachi High-Tech Science Corporation
- Ayana Muraki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,239,046
- Issue date Feb 1, 2022
- Hitachi High-Tech Science Corporation
- Ayana Muraki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and control method thereof
- Patent number 11,177,113
- Issue date Nov 16, 2021
- Hitachi High-Tech Science Corporation
- Ayana Muraki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus
- Patent number 11,133,149
- Issue date Sep 28, 2021
- Hitachi High-Tech Science Corporation
- Toshihiro Mochizuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic sample preparation apparatus and automatic sample prepara...
- Patent number 11,073,453
- Issue date Jul 27, 2021
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic sample preparation apparatus
- Patent number 10,677,697
- Issue date Jun 9, 2020
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,658,147
- Issue date May 19, 2020
- Hitachi High-Tech Science Corporation
- Makoto Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Portable information terminal, beam irradiation system, and program
- Patent number 10,485,087
- Issue date Nov 19, 2019
- Hitachi High-Tech Science Corporation
- Takuma Aso
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for cross-section processing and observation and apparatus t...
- Patent number 10,242,842
- Issue date Mar 26, 2019
- Hitachi High-Tech Science Corporation
- Xin Man
- G02 - OPTICS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,236,159
- Issue date Mar 19, 2019
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample positioning method and charged particle beam apparatus
- Patent number 10,186,398
- Issue date Jan 22, 2019
- Hitachi High-Tech Science Corporation
- Masahiro Kiyohara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-section processing-and-observation method and cross-section p...
- Patent number 10,096,449
- Issue date Oct 9, 2018
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic sample preparation apparatus
- Patent number 10,088,401
- Issue date Oct 2, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Grant
Cross-section processing and observation method and cross-section p...
- Patent number 9,966,226
- Issue date May 8, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus, method for observing cross-section of s...
- Patent number 9,934,938
- Issue date Apr 3, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,741,535
- Issue date Aug 22, 2017
- Hitachi High-Tech Science Corporation
- Shota Torikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,620,333
- Issue date Apr 11, 2017
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross section processing method and cross section processing apparatus
- Patent number 9,548,185
- Issue date Jan 17, 2017
- Hitachi High-Tech Science Corporation
- Hidekazu Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, control method for charged particle b...
- Patent number 9,368,323
- Issue date Jun 14, 2016
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-section processing-and-observation method and cross-section p...
- Patent number 9,347,896
- Issue date May 24, 2016
- Hitachi High-Tech Science Corporation
- Xin Man
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,336,987
- Issue date May 10, 2016
- Hitachi High-Tech Science Corporation
- Shota Torikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,318,303
- Issue date Apr 19, 2016
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample observation method, sample preparation method, and charged p...
- Patent number 9,287,087
- Issue date Mar 15, 2016
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus having needle probe that tracks tar...
- Patent number 9,275,827
- Issue date Mar 1, 2016
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,245,713
- Issue date Jan 26, 2016
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus having improved needle movement con...
- Patent number 9,218,937
- Issue date Dec 22, 2015
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CONTROL METHOD, CHARGED PARTICLE BEAM DEVICE, AND PROGRAM
- Publication number 20240379323
- Publication date Nov 14, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki NAGAMINE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF
- Publication number 20220084785
- Publication date Mar 17, 2022
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ayana MURAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS
- Publication number 20210341362
- Publication date Nov 4, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210296084
- Publication date Sep 23, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masahiro KIYOHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210090850
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ayana MURAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM APPARATUS
- Publication number 20210090854
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshihiro MOCHIZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM APPARATUS
- Publication number 20210090849
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Haruyuki ISHII
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210090851
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ayana MURAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS AND AUTOMATIC SAMPLE PREPARA...
- Publication number 20200355589
- Publication date Nov 12, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF
- Publication number 20200312617
- Publication date Oct 1, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ayana MURAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS
- Publication number 20200278281
- Publication date Sep 3, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS
- Publication number 20190025167
- Publication date Jan 24, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PORTABLE INFORMATION TERMINAL, BEAM IRRADIATION SYSTEM, AND PROGRAM
- Publication number 20180288865
- Publication date Oct 4, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Takuma ASO
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD FOR CROSS-SECTION PROCESSING AND OBSERVATION AND APPARATUS T...
- Publication number 20170278668
- Publication date Sep 28, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- G02 - OPTICS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20170278664
- Publication date Sep 28, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Makoto SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20170178858
- Publication date Jun 22, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS
- Publication number 20170122852
- Publication date May 4, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE POSITIONING METHOD AND CHARGED PARTICLE BEAM APPARATUS
- Publication number 20170092460
- Publication date Mar 30, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masahiro KIYOHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS-SECTION PROCESSING-AND-OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20160343541
- Publication date Nov 24, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20160093467
- Publication date Mar 31, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Shota TORIKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20160064187
- Publication date Mar 3, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20150262788
- Publication date Sep 17, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150228451
- Publication date Aug 13, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150228450
- Publication date Aug 13, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150221473
- Publication date Aug 6, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Shota TORIKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, CONTROL METHOD FOR CHARGED PARTICLE B...
- Publication number 20150206702
- Publication date Jul 23, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS SECTION PROCESSING METHOD AND CROSS SECTION PROCESSING APPARATUS
- Publication number 20150115156
- Publication date Apr 30, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hidekazu SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150060695
- Publication date Mar 5, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20150060668
- Publication date Mar 5, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS-SECTION PROCESSING-AND-OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20150060664
- Publication date Mar 5, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- G01 - MEASURING TESTING

Atsushi Uemoto

Person

Patents Grantslast 30 patents

Automatic sample preparation apparatus

Charged particle beam apparatus and control method thereof

Focused ion beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus and control method thereof

Focused ion beam apparatus

Automatic sample preparation apparatus and automatic sample prepara...

Automatic sample preparation apparatus

Charged particle beam apparatus

Portable information terminal, beam irradiation system, and program

Method for cross-section processing and observation and apparatus t...

Charged particle beam apparatus

Sample positioning method and charged particle beam apparatus

Cross-section processing-and-observation method and cross-section p...

Automatic sample preparation apparatus

Cross-section processing and observation method and cross-section p...

Focused ion beam apparatus, method for observing cross-section of s...

Charged particle beam apparatus

Charged particle beam apparatus

Cross section processing method and cross section processing apparatus

Charged particle beam device, control method for charged particle b...

Cross-section processing-and-observation method and cross-section p...

Charged particle beam apparatus

Charged particle beam apparatus

Sample observation method, sample preparation method, and charged p...

Charged particle beam apparatus having needle probe that tracks tar...

Charged particle beam apparatus

Charged particle beam apparatus having improved needle movement con...

Patents Applicationslast 30 patents

CONTROL METHOD, CHARGED PARTICLE BEAM DEVICE, AND PROGRAM

CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF

AUTOMATIC SAMPLE PREPARATION APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

FOCUSED ION BEAM APPARATUS

FOCUSED ION BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

AUTOMATIC SAMPLE PREPARATION APPARATUS AND AUTOMATIC SAMPLE PREPARA...

CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF

AUTOMATIC SAMPLE PREPARATION APPARATUS

AUTOMATIC SAMPLE PREPARATION APPARATUS

PORTABLE INFORMATION TERMINAL, BEAM IRRADIATION SYSTEM, AND PROGRAM

METHOD FOR CROSS-SECTION PROCESSING AND OBSERVATION AND APPARATUS T...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

AUTOMATIC SAMPLE PREPARATION APPARATUS

SAMPLE POSITIONING METHOD AND CHARGED PARTICLE BEAM APPARATUS

CROSS-SECTION PROCESSING-AND-OBSERVATION METHOD AND CROSS-SECTION P...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE, CONTROL METHOD FOR CHARGED PARTICLE B...

CROSS SECTION PROCESSING METHOD AND CROSS SECTION PROCESSING APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CROSS-SECTION PROCESSING-AND-OBSERVATION METHOD AND CROSS-SECTION P...