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Atsuya NIWANO

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Patents Grantslast 30 patents

  • Information Patent Grant

    Panel module unit
    • Patent number 11,690,186
    • Issue date Jun 27, 2023
    • Mitutoyo Corporation
    • Yuhei Takatsu
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Measuring instrument that detects displacement of a contact point
    • Patent number 10,598,524
    • Issue date Mar 24, 2020
    • Mitutoyo Corporation
    • Atsuya Niwano
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Measurement instrument and reflection device used for same
    • Patent number 10,467,991
    • Issue date Nov 5, 2019
    • Mitutoyo Corporation
    • Atsuya Niwano
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    External device for measuring instrument
    • Patent number 10,451,450
    • Issue date Oct 22, 2019
    • Mitutoyo Corporation
    • Atsuya Niwano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Connection unit for connecting external device to measurement devic...
    • Patent number 10,283,922
    • Issue date May 7, 2019
    • Mitutoyo Corporation
    • Atsuya Niwano
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Wireless communication device
    • Patent number D825557
    • Issue date Aug 14, 2018
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D14 - Recording, communication, or information retrieval equipment
  • Information Patent Grant

    Wireless communication device
    • Patent number D821393
    • Issue date Jun 26, 2018
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D14 - Recording, communication, or information retrieval equipment
  • Information Patent Grant

    Connection device for communication
    • Patent number D819631
    • Issue date Jun 5, 2018
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D14 - Recording, communication, or information retrieval equipment
  • Information Patent Grant

    Measuring instrument
    • Patent number 9,798,445
    • Issue date Oct 24, 2017
    • Mitutoyo Corporation
    • Atsuya Niwano
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Digital dial gauge
    • Patent number D790379
    • Issue date Jun 27, 2017
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Micrometer
    • Patent number 9,372,059
    • Issue date Jun 21, 2016
    • Mitutoyo Corporation
    • Yoshiro Asano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Display plate for measurement
    • Patent number D747987
    • Issue date Jan 26, 2016
    • Mitutoyo Corporation
    • Shigeru Ohtani
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Digital dial gauge
    • Patent number D747988
    • Issue date Jan 26, 2016
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Micrometer
    • Patent number D740143
    • Issue date Oct 6, 2015
    • Mitutoyo Corporation
    • Yoshiro Asano
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Micrometer
    • Patent number D729659
    • Issue date May 19, 2015
    • Mitutoyo Corporation
    • Yoshiro Asano
    • D10 - Measuring, testing, or signalling instruments

Patents Applicationslast 30 patents

  • Information Patent Application

    PANEL MODULE UNIT
    • Publication number 20220124922
    • Publication date Apr 21, 2022
    • Mitutoyo Corporation
    • Yuhei TAKATSU
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    MEASUREMENT INSTRUMENT AND REFLECTION DEVICE USED FOR SAME
    • Publication number 20180211637
    • Publication date Jul 26, 2018
    • Mitutoyo Corporation
    • Atsuya NIWANO
    • G02 - OPTICS
  • Information Patent Application

    CONNECTION UNIT FOR CONNECTING EXTERNAL DEVICE TO MEASUREMENT DEVIC...
    • Publication number 20180115129
    • Publication date Apr 26, 2018
    • Mitutoyo Corporation
    • Atsuya NIWANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    EXTERNAL DEVICE FOR MEASURING INSTRUMENT
    • Publication number 20180052017
    • Publication date Feb 22, 2018
    • Mitutoyo Corporation
    • Atsuya NIWANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASURING INSTRUMENT
    • Publication number 20180031398
    • Publication date Feb 1, 2018
    • Mitutoyo Corporation
    • Atsuya NIWANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASURING INSTRUMENT
    • Publication number 20150286354
    • Publication date Oct 8, 2015
    • MITUTOYO CORPORATION
    • Atsuya NIWANO
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    MICROMETER
    • Publication number 20150059196
    • Publication date Mar 5, 2015
    • MITUTOYO CORPORATION
    • Yoshiro ASANO
    • G01 - MEASURING TESTING