Atsuyuki DOI

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Saitama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test head and semiconductor wafer test apparatus comprising same
- Patent number 8,890,558
- Issue date Nov 18, 2014
- Advantest Corporation
- Atsuyuki Doi
- G01 - MEASURING TESTING
Information Patent Grant
Attachment apparatus, test head, and electronic device test system
- Patent number 7,746,060
- Issue date Jun 29, 2010
- Advantest Corporation
- Atsuyuki Doi
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in apparatus
- Patent number 7,271,605
- Issue date Sep 18, 2007
- Advantest Corporation
- Takashi Naitou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST HEAD AND SEMICONDUCTOR WAFER TEST APPARATUS COMPRISING SAME
- Publication number 20110241716
- Publication date Oct 6, 2011
- Advantest Corporation
- Atsuyuki DOI
- G01 - MEASURING TESTING
Information Patent Application
ATTACHMENT APPARATUS, TEST HEAD, AND ELECTRONIC DEVICE TEST SYSTEM
- Publication number 20090184720
- Publication date Jul 23, 2009
- Advantest Corporation
- Atsuyuki Doi
- G01 - MEASURING TESTING
Information Patent Application
Burn-in apparatus
- Publication number 20060238188
- Publication date Oct 26, 2006
- Takashi Naitou
- G01 - MEASURING TESTING