Atsuyuki ICHIKAWA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
System for centering a sample tube for use with an NMR measurement...
- Patent number 11,675,031
- Issue date Jun 13, 2023
- Jeol Ltd.
- Yuki Endo
- G01 - MEASURING TESTING
Information Patent Grant
Sputtering apparatus and processing apparatus
- Patent number 10,062,553
- Issue date Aug 28, 2018
- Canon Anelva Corporation
- Taichi Hiromi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
NMR Measurement System and Sample Tube Centering Method
- Publication number 20210278487
- Publication date Sep 9, 2021
- JEOL Ltd.
- Yuki Endo
- G01 - MEASURING TESTING
Information Patent Application
SPUTTERING APPARATUS AND PROCESSING APPARATUS
- Publication number 20170140907
- Publication date May 18, 2017
- Canon ANELVA Corporation
- Taichi HIROMI
- G01 - MEASURING TESTING