Aubin P. J. Roy

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Gatineau, CA

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Patents Grantslast 30 patents

Information Patent Grant
Circuit and method for measuring delay of high speed signals
- Patent number 7,453,255
- Issue date Nov 18, 2008
- LogicVision, Inc.
- Stephen K. Sunter
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for measuring jitter of high speed signals
- Patent number 7,158,899
- Issue date Jan 2, 2007
- LogicVision, Inc.
- Stephen K. Sunter
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Circuit and method for testing high speed data circuits
- Patent number 6,895,535
- Issue date May 17, 2005
- LogicVision, Inc.
- Stephen K. Sunter
- G01 - MEASURING TESTING
Information Patent Grant
Circuit synthesis method using technology parameters extracting cir...
- Patent number 6,567,971
- Issue date May 20, 2003
- LogicVision, Inc.
- Walter H. Banzhaf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and circuit for built in self test of phase locked loops
- Patent number 6,396,889
- Issue date May 28, 2002
- LogicVision, Inc.
- Stephen Kenneth Sunter
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Programmable clock signal generation circuits and methods for gener...
- Patent number 6,204,694
- Issue date Mar 20, 2001
- LogicVision, Inc.
- Stephen Kenneth Sunter
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Circuit and method for measuring delay of high speed signals
- Publication number 20050111537
- Publication date May 26, 2005
- Stephen K. Sunter
- G01 - MEASURING TESTING
Information Patent Application
Circuit and method for measuring jitter of high speed signals
- Publication number 20050069031
- Publication date Mar 31, 2005
- Stephen K. Sunter
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Circuit and method for testing high speed data circuits
- Publication number 20040123197
- Publication date Jun 24, 2004
- Stephen K. Sunter
- G01 - MEASURING TESTING