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Aubrey Sparkman
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Austin, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Information handling system and printed circuit board having test s...
Patent number
7,728,273
Issue date
Jun 1, 2010
Dell Products, L.P.
Randy Hemingway
G01 - MEASURING TESTING
Information
Patent Grant
Method of processing a circuit board
Patent number
7,676,920
Issue date
Mar 16, 2010
Dell Products L.P.
Sandor T. Farkas
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Timing markers for the measurement and testing of the controlled im...
Patent number
6,922,062
Issue date
Jul 26, 2005
Dell Products L.P.
Aubrey K. Sparkman
G01 - MEASURING TESTING
Information
Patent Grant
Method for testing and burning-in a semiconductor wafer
Patent number
5,597,737
Issue date
Jan 28, 1997
Motorola Inc.
Stuart E. Greer
G01 - MEASURING TESTING
Information
Patent Grant
Single metal-plate bypass capacitor
Patent number
5,377,072
Issue date
Dec 27, 1994
Motorola Inc.
Aubrey K. Sparkman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device having voltage distribution ring(s) and method...
Patent number
5,343,074
Issue date
Aug 30, 1994
Motorola, Inc.
Leo M. Higgins
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
NON-DESTRUCTIVE TEST STRUCTURE FOR PRINTED CIRCUIT BOARD CHARACTERI...
Publication number
20080164885
Publication date
Jul 10, 2008
DELL PRODUCTS, L.P.
Randy Hemingway
G01 - MEASURING TESTING
Information
Patent Application
Combination Impedance/Back Drill Coupon
Publication number
20080087461
Publication date
Apr 17, 2008
Dell Products L.P.
Sandor T. Farkas
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Timing markers used in the measurement and testing of a printed cir...
Publication number
20040130334
Publication date
Jul 8, 2004
DELL PRODUCTS L.P.
Aubrey K. Sparkman
G01 - MEASURING TESTING