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Hsinchu City, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Computer-aided design system to automate scan synthesis at register...
Patent number
8,543,950
Issue date
Sep 24, 2013
Syntest Technologies, Inc.
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING
Information
Patent Grant
High speed ATPG testing circuit and method
Patent number
7,900,107
Issue date
Mar 1, 2011
Faraday Technology Corp.
Wang-Chin Chen
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for shifting at-speed scan patterns in a scan-...
Patent number
7,512,851
Issue date
Mar 31, 2009
Syntest Technologies, Inc.
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Grant
Computer-aided design system to automate scan synthesis at register...
Patent number
7,331,032
Issue date
Feb 12, 2008
Syntest Technologies, Inc.
Laung-Terng (L. -T.) Wang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Computer-aided design system to automate scan synthesis at register...
Patent number
6,957,403
Issue date
Oct 18, 2005
Syntest Technologies, Inc.
Laung-Terng Wang
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
COMPUTER-AIDED DESIGN SYSTEM TO AUTOMATE SCAN SYNTHESIS AT REGISTER...
Publication number
20120246604
Publication date
Sep 27, 2012
Syntest Technologies, Inc.
Laung-Terng (L. -T.) WANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HIGH SPEED ATPG TESTING CIRCUIT AND METHOD
Publication number
20100050030
Publication date
Feb 25, 2010
Faraday Technology Corp.
Wang-Chin Chen
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for shifting at-speed scan patterns in a scan-...
Publication number
20050055617
Publication date
Mar 10, 2005
Laung-Terng Wang
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for testing asynchronous set/reset faults in a...
Publication number
20040153926
Publication date
Aug 5, 2004
Khader S. Abdel-Hafez
G01 - MEASURING TESTING
Information
Patent Application
Computer-aided design system to automate scan synthesis at register...
Publication number
20030023941
Publication date
Jan 30, 2003
Laung-Terng (L.-T.) Wang
G01 - MEASURING TESTING