August J. Fischer

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Bi-layer etch stop process for defect reduction and via stress migr...
- Patent number 7,423,344
- Issue date Sep 9, 2008
- Texas Instruments Incorporated
- Tae S. Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bi-layer etch stop process for defect reduction and via stress migr...
- Patent number 7,199,047
- Issue date Apr 3, 2007
- Texas Instruments Incorporated
- Tae S. Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for chemical vapor deposition of tungsten on silicon or die...
- Patent number 6,641,867
- Issue date Nov 4, 2003
- Texas Instruments Incorporated
- Wei-Yung Hsu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
Bi-layer etch stop process for defect reduction and via stress migr...
- Publication number 20070134918
- Publication date Jun 14, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Tae S. Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bi-layer etch stop process for defect reduction and via stress migr...
- Publication number 20050274955
- Publication date Dec 15, 2005
- TEXAS INSTRUMENTS INCORPORATED
- Tae S. Kim
- H01 - BASIC ELECTRIC ELEMENTS