Aurelius L. Graninger

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Essex Junction, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for semiconductor line scribe line centering
- Patent number 9,514,999
- Issue date Dec 6, 2016
- GLOBALFOUNDRIES Inc.
- Jeanne P. Bickford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining intra-die variation of an integrated circuit
- Patent number 9,255,962
- Issue date Feb 9, 2016
- GLOBALFOUNDRIES, INC.
- Jeanne P. S. Bickford
- G01 - MEASURING TESTING
Information Patent Grant
Determining overall optimal yield point for a semiconductor wafer
- Patent number 8,839,159
- Issue date Sep 16, 2014
- International Business Machine Corporation
- Igor Arsovski
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DETERMINING INTRA-DIE VARIATION OF AN INTEGRATED CIRCUIT
- Publication number 20150048860
- Publication date Feb 19, 2015
- International Business Machines Corporation
- Jeanne P.S. Bickford
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING OVERALL OPTIMAL YIELD POINT FOR A SEMICONDUCTOR WAFER
- Publication number 20140201697
- Publication date Jul 17, 2014
- International Business Machines Corporation
- Igor Arsovski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR LINE SCRIBE CENTERING
- Publication number 20140188265
- Publication date Jul 3, 2014
- International Business Machines Corporation
- Jeanne P. BICKFORD
- H01 - BASIC ELECTRIC ELEMENTS