Aurélien FAY

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Grenoble, FR

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Patents Grantslast 30 patents

Information Patent Grant
Method for calculating the metrics of an IC manufacturing process
- Patent number 10,423,074
- Issue date Sep 24, 2019
- Aselta Nanographics
- Mohamed Saïb
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CALCULATING THE METRICS OF AN IC MANUFACTURING PROCESS
- Publication number 20170123322
- Publication date May 4, 2017
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Mohamed SAÏB
- G06 - COMPUTING CALCULATING COUNTING