Aurélien Philippe Jean Maclou Botman

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Particle-induced x-ray emission (PIXE) using hydrogen and multi-spe...
- Patent number 12,061,159
- Issue date Aug 13, 2024
- FEI Company
- Daniel Totonjian
- G01 - MEASURING TESTING
Information Patent Grant
Method for alignment of a light beam to a charged particle beam
- Patent number 10,777,383
- Issue date Sep 15, 2020
- FEI Company
- Cameron James Zachreson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive beam current for high throughput patterning
- Patent number 10,415,133
- Issue date Sep 17, 2019
- FEI Company
- Aurelien Philippe Jean Maclou Botman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Collision ionization source
- Patent number 10,325,750
- Issue date Jun 18, 2019
- FEI Company
- Gregory A. Schwind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of modifying a sample surface layer from a microscopic sample
- Patent number 10,105,734
- Issue date Oct 23, 2018
- FEI Company
- Tomas Vystavel
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of depositing material
- Patent number 9,951,417
- Issue date Apr 24, 2018
- FEI Company
- Aurelien Philippe Jean Maclou Botman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Collision ionization ion source
- Patent number 9,899,181
- Issue date Feb 20, 2018
- FEI Company
- Gregory A. Schwind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Localized, in-vacuum modification of small structures
- Patent number 9,812,286
- Issue date Nov 7, 2017
- FEI Company
- David H. Narum
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Integrated light optics and gas delivery in a charged particle lens
- Patent number 9,478,390
- Issue date Oct 25, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for in situ reactivation of fluorescence marker
- Patent number 9,269,530
- Issue date Feb 23, 2016
- FEI Company
- Aurélien Philippe Jean Maclou Botman
- G01 - MEASURING TESTING
Information Patent Grant
Localized, in-vacuum modification of small structures
- Patent number 9,255,339
- Issue date Feb 9, 2016
- FEI Company
- Aurelien Philippe Jean Maclou Botman
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Microfluidics delivery systems
- Patent number 9,044,781
- Issue date Jun 2, 2015
- FEI Company
- Aurélien Philippe Jean Maclou Botman
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
In situ reactivation of fluorescence marker
- Patent number 8,872,105
- Issue date Oct 28, 2014
- FEI Company
- Aurélien Philippe Jean Maclou Botman
- G01 - MEASURING TESTING
Information Patent Grant
Method of depositing material
- Patent number 8,853,078
- Issue date Oct 7, 2014
- FEI Company
- Aurelien Philippe Jean Maclou Botman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
- Publication number 20240418660
- Publication date Dec 19, 2024
- FEI Company
- Daniel TOTONJIAN
- G01 - MEASURING TESTING
Information Patent Application
CONDENSATE PRECURSORS AND CONTAMINANT PURGE APPARATUS AND METHODS
- Publication number 20240222068
- Publication date Jul 4, 2024
- FEI Company
- Jing Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD AND SYSTEM FOR PREPARING A SPECIMEN
- Publication number 20240071720
- Publication date Feb 29, 2024
- FEI Company
- Jamie Dee Gravell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...
- Publication number 20230341341
- Publication date Oct 26, 2023
- FEI Company
- Daniel TOTONJIAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR LARGE-AREA 3D ANALYSIS OF SAMPLES USING GLANCING INCIDEN...
- Publication number 20210118646
- Publication date Apr 22, 2021
- FEI Company
- Chad Rue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLLISION IONIZATION SOURCE
- Publication number 20180211807
- Publication date Jul 26, 2018
- FEI Company
- Gregory A. Schwind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTIVE BEAM CURRENT FOR HIGH THROUGHPUT PATTERNING
- Publication number 20170002455
- Publication date Jan 5, 2017
- FEI Company
- Aurelien Philippe Jean Maclou Botman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ADAPTIVE CONTROL FOR CHARGED PARTICLE BEAM PROCESSING
- Publication number 20170002467
- Publication date Jan 5, 2017
- FEI Company
- Marcus Straw
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD OF MODIFYING A SAMPLE SURFACE LAYER FROM A MICROSCOPIC SAMPLE
- Publication number 20160199878
- Publication date Jul 14, 2016
- FEI Company
- Tomas Vystavel
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
LOCALIZED, IN-VACUUM MODIFICATION OF SMALL STRUCTURES
- Publication number 20160189920
- Publication date Jun 30, 2016
- FEI Company
- David H. Narum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED LIGHT OPTICS AND GAS DELIVERY IN A CHARGED PARTICLE LENS
- Publication number 20150380205
- Publication date Dec 31, 2015
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DEPOSITING MATERIAL
- Publication number 20150099071
- Publication date Apr 9, 2015
- FEI Company
- Aurélien Philippe Jean Maclou Botman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEM FOR IN SITU REACTIVATION OF FLUORESCENCE MARKER
- Publication number 20150028205
- Publication date Jan 29, 2015
- FEI Company
- Aurélien Philippe Jean Maclou Botman
- G01 - MEASURING TESTING
Information Patent Application
In Situ Reactivation of Fluorescence Marker
- Publication number 20140231644
- Publication date Aug 21, 2014
- FEI Company
- Aurélien Philippe Jean Maclou Botman
- G01 - MEASURING TESTING
Information Patent Application
Microfluidics Delivery Systems
- Publication number 20140151335
- Publication date Jun 5, 2014
- Aurélien Philipp Jean Maclou Botman
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
Localized, In-Vacuum Modification of Small Structures
- Publication number 20130068611
- Publication date Mar 21, 2013
- FEI Company
- Aurelien Philippe Jean Maclou Botman
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

Aurélien Philippe Jean Maclou Botman

Person

Patents Grantslast 30 patents

Particle-induced x-ray emission (PIXE) using hydrogen and multi-spe...

Method for alignment of a light beam to a charged particle beam

Adaptive beam current for high throughput patterning

Collision ionization source

Method of modifying a sample surface layer from a microscopic sample

Method of depositing material

Collision ionization ion source

Localized, in-vacuum modification of small structures

Integrated light optics and gas delivery in a charged particle lens

System for in situ reactivation of fluorescence marker

Localized, in-vacuum modification of small structures

Microfluidics delivery systems

In situ reactivation of fluorescence marker

Method of depositing material

Patents Applicationslast 30 patents

PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...

CONDENSATE PRECURSORS AND CONTAMINANT PURGE APPARATUS AND METHODS

METHOD AND SYSTEM FOR PREPARING A SPECIMEN

PARTICLE-INDUCED X-RAY EMISSION (PIXE) USING HYDROGEN AND MULTI-SPE...

METHOD FOR LARGE-AREA 3D ANALYSIS OF SAMPLES USING GLANCING INCIDEN...

COLLISION IONIZATION SOURCE

ADAPTIVE BEAM CURRENT FOR HIGH THROUGHPUT PATTERNING

ADAPTIVE CONTROL FOR CHARGED PARTICLE BEAM PROCESSING

METHOD OF MODIFYING A SAMPLE SURFACE LAYER FROM A MICROSCOPIC SAMPLE

LOCALIZED, IN-VACUUM MODIFICATION OF SMALL STRUCTURES

INTEGRATED LIGHT OPTICS AND GAS DELIVERY IN A CHARGED PARTICLE LENS

METHOD OF DEPOSITING MATERIAL

SYSTEM FOR IN SITU REACTIVATION OF FLUORESCENCE MARKER

In Situ Reactivation of Fluorescence Marker

Microfluidics Delivery Systems

Localized, In-Vacuum Modification of Small Structures