Avi Abramov

Person

Haifa, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Optical metrology utilizing short-wave infrared wavelengths
- Patent number 12,111,580
- Issue date Oct 8, 2024
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Enhancing performance of overlay metrology
- Patent number 12,001,148
- Issue date Jun 4, 2024
- KLA Corporation
- Amnon Manassen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Broadband illumination tuning
- Patent number 11,662,562
- Issue date May 30, 2023
- KLA Corporation
- Andrew V. Hill
- G02 - OPTICS
Information Patent Grant
Enhancing performance of overlay metrology
- Patent number 11,592,755
- Issue date Feb 28, 2023
- KLA Corporation
- Amnon Manassen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Pupil-plane beam scanning for metrology
- Patent number 11,300,524
- Issue date Apr 12, 2022
- KLA Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Spectral filter for high-power fiber illumination sources
- Patent number 11,187,838
- Issue date Nov 30, 2021
- KLA Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Grant
High-brightness illumination source for optical metrology
- Patent number 11,156,846
- Issue date Oct 26, 2021
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Localized telecentricity and focus optimization for overlay metrology
- Patent number 10,677,588
- Issue date Jun 9, 2020
- KLA-Tencor Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Systems for providing illumination in optical metrology
- Patent number 10,203,247
- Issue date Feb 12, 2019
- KLA-Tencor Corporation
- Gregory R. Brady
- F21 - LIGHTING
Information Patent Grant
Spectral control system
- Patent number 9,921,050
- Issue date Mar 20, 2018
- KLA-Tencor Corporation
- Amnon Manassen
- G02 - OPTICS
Information Patent Grant
Compressive sensing with illumination patterning
- Patent number 9,719,940
- Issue date Aug 1, 2017
- KLA-Tencor Corporation
- Amnon Manassen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Systems for providing illumination in optical metrology
- Patent number 9,512,985
- Issue date Dec 6, 2016
- KLA-Tencor Corporation
- Gregory R. Brady
- G02 - OPTICS
Information Patent Grant
Spectral control system
- Patent number 9,341,769
- Issue date May 17, 2016
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ENHANCING PERFORMANCE OF OVERLAY METROLOGY
- Publication number 20230400780
- Publication date Dec 14, 2023
- KLA Corporation
- Amnon Manassen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ENHANCING PERFORMANCE OF OVERLAY METROLOGY
- Publication number 20220317577
- Publication date Oct 6, 2022
- KLA Corporation
- Amnon Manassen
- G02 - OPTICS
Information Patent Application
OPTICAL METROLOGY UTILIZING SHORT-WAVE INFRARED WAVELENGTHS
- Publication number 20220291143
- Publication date Sep 15, 2022
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
BROADBAND ILLUMINATION TUNING
- Publication number 20210247601
- Publication date Aug 12, 2021
- KLA Corporation
- Andrew V. Hill
- G02 - OPTICS
Information Patent Application
High-Brightness Illumination Source for Optical Metrology
- Publication number 20200333612
- Publication date Oct 22, 2020
- KLA-Tencor Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
Localized Telecentricity and Focus Optimization for Overlay Metrology
- Publication number 20190310080
- Publication date Oct 10, 2019
- KLA-Tencor Corporation
- Andrew V. Hill
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Spectral Filter for High-Power Fiber Illumination Sources
- Publication number 20190033501
- Publication date Jan 31, 2019
- KLA-Tencor Corporation
- Andrew V. Hill
- G02 - OPTICS
Information Patent Application
Systems for Providing Illumination in Optical Metrology
- Publication number 20170146399
- Publication date May 25, 2017
- KLA-Tencor Corporation
- Gregory R. Brady
- G02 - OPTICS
Information Patent Application
Spectral Control System
- Publication number 20160305766
- Publication date Oct 20, 2016
- KLA-Tencor Corporation
- Amnon Manassen
- G02 - OPTICS
Information Patent Application
COMPRESSIVE SENSING WITH ILLUMINATION PATTERNING
- Publication number 20160025646
- Publication date Jan 28, 2016
- KLA-Tencor Corporation
- Amnon MANASSEN
- G01 - MEASURING TESTING
Information Patent Application
Systems for Providing Illumination in Optical Metrology
- Publication number 20140240951
- Publication date Aug 28, 2014
- KLA-Tencor Corporation
- Gregory R. Brady
- G02 - OPTICS
Information Patent Application
Spectral Control System
- Publication number 20140168650
- Publication date Jun 19, 2014
- Amnon Manassen
- G02 - OPTICS

Avi Abramov

Person

Patents Grantslast 30 patents

Optical metrology utilizing short-wave infrared wavelengths

Enhancing performance of overlay metrology

Broadband illumination tuning

Enhancing performance of overlay metrology

Pupil-plane beam scanning for metrology

Spectral filter for high-power fiber illumination sources

High-brightness illumination source for optical metrology

Localized telecentricity and focus optimization for overlay metrology

Systems for providing illumination in optical metrology

Spectral control system

Compressive sensing with illumination patterning

Systems for providing illumination in optical metrology

Spectral control system

Patents Applicationslast 30 patents

ENHANCING PERFORMANCE OF OVERLAY METROLOGY

ENHANCING PERFORMANCE OF OVERLAY METROLOGY

OPTICAL METROLOGY UTILIZING SHORT-WAVE INFRARED WAVELENGTHS

BROADBAND ILLUMINATION TUNING

High-Brightness Illumination Source for Optical Metrology

Localized Telecentricity and Focus Optimization for Overlay Metrology

Spectral Filter for High-Power Fiber Illumination Sources

Systems for Providing Illumination in Optical Metrology

Spectral Control System

COMPRESSIVE SENSING WITH ILLUMINATION PATTERNING

Systems for Providing Illumination in Optical Metrology

Spectral Control System