Avi Ben-Gigi

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Migdal Haemek, IL

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Patents Grantslast 30 patents

Information Patent Grant
Protection against in-process charging in silicon-oxide-nitride-oxi...
- Patent number 7,439,575
- Issue date Oct 21, 2008
- Tower Semiconductor Ltd.
- Yakov Roizin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of decreasing charging effects in oxide-nitride-oxide (ONO)...
- Patent number 7,060,627
- Issue date Jun 13, 2006
- Tower Semiconductor Ltd.
- Micha Gutman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Protection against in-process charging in silicon-oxide-nitride-oxi...
- Patent number 6,959,920
- Issue date Nov 1, 2005
- Tower Semiconductor Ltd.
- Yakov Roizin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Protection againts in-process charging in silicon-oxide-nitride-oxi...
- Publication number 20050139903
- Publication date Jun 30, 2005
- Tower Semiconductor Ltd.
- Yakov Roizin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of decreasing charging effects in oxide-nitride-oxide (ONO)...
- Publication number 20050054161
- Publication date Mar 10, 2005
- Tower Semiconductor Ltd.
- Micha Gutman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Protection against in-process charging in silicon-oxide-nitride-oxi...
- Publication number 20050051838
- Publication date Mar 10, 2005
- Tower Semiconductor Ltd.
- Yakov Roizin
- H01 - BASIC ELECTRIC ELEMENTS