Avid Kamgar

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Millington, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for reliability testing integrated circuit metal films
- Patent number 5,057,441
- Issue date Oct 15, 1991
- AT&T Bell Laboratories
- Gregory M. Gutt
- G01 - MEASURING TESTING
Information Patent Grant
Nitrided silicon dioxide layers for semiconductor integrated circuits
- Patent number 4,623,912
- Issue date Nov 18, 1986
- AT&T Bell Laboratories
- Chuan C. Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication of semiconductor devices including double annealing ste...
- Patent number 4,364,779
- Issue date Dec 21, 1982
- Bell Telephone Laboratories, Incorporated
- Avid Kamgar
- H01 - BASIC ELECTRIC ELEMENTS