Avijit K. Ray-Chaudhuri

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San Ramon, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Defect detection and classification based on attributes determined...
- Patent number 10,127,652
- Issue date Nov 13, 2018
- KLA-Tencor Corp.
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fourier filters and wafer inspection systems
- Patent number 7,345,754
- Issue date Mar 18, 2008
- KLA-Tencor Technologies Corp.
- Guoheng Zhao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT DETECTION AND CLASSIFICATION BASED ON ATTRIBUTES DETERMINED...
- Publication number 20150221076
- Publication date Aug 6, 2015
- KLA-Tencor Corporation
- Lisheng Gao
- G06 - COMPUTING CALCULATING COUNTING