Aviram Tam

Person

  • Nes Ziona, IL

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    AERIAL MASK INSPECTION BASED WEAK POINT ANALYSIS

    • Publication number 20150346610
    • Publication date Dec 3, 2015
    • APPLIED MATERIALS ISRAEL, LTD.
    • Aviram Tam
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    DETECTION OF WEAK POINTS OF A MASK

    • Publication number 20140270468
    • Publication date Sep 18, 2014
    • APPLIED MATERIALS ISRAEL, LTD.
    • Aviram Tam
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Advanced Roughness Metrology

    • Publication number 20090114816
    • Publication date May 7, 2009
    • Aviram Tam
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Measurement System and a Method

    • Publication number 20080290288
    • Publication date Nov 27, 2008
    • Aviram Tam
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Measurement of corner roundness

    • Publication number 20050069192
    • Publication date Mar 31, 2005
    • Kris Roman
    • G06 - COMPUTING CALCULATING COUNTING