Avishay Guetta

Person

Rehovot, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Free space optical communication system
- Patent number 10,637,574
- Issue date Apr 28, 2020
- SHILAT OPTRONICS LTD.
- Avishay Guetta
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Laser daylight designation and pointing
- Patent number 9,927,210
- Issue date Mar 27, 2018
- SHILAT OPTICAL SYSTEMS LTD.
- Avishay Guetta
- F41 - WEAPONS
Information Patent Grant
Terrain surveillance system
- Patent number 9,761,102
- Issue date Sep 12, 2017
- Shilat Optronics Ltd
- Avishay Guetta
- G08 - SIGNALLING
Information Patent Grant
Laser daylight designation and pointing
- Patent number 9,590,000
- Issue date Mar 7, 2017
- SHILAT OPTICAL SYSTEMS LTD.
- Avishay Guetta
- F41 - WEAPONS
Information Patent Grant
Three dimensional measurement system
- Patent number 9,217,635
- Issue date Dec 22, 2015
- Shilat Optronics Ltd
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Grant
Intrusion warning system
- Patent number 8,970,374
- Issue date Mar 3, 2015
- Shilat Optronics Ltd
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system for optical inspection
- Patent number 8,134,699
- Issue date Mar 13, 2012
- Applied Materials, Inc.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system for optical inspection
- Patent number 7,924,419
- Issue date Apr 12, 2011
- Applied Materials Israel, Ltd.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Grant
Multiple optical head inspection system and a method for imaging an...
- Patent number 7,841,529
- Issue date Nov 30, 2010
- Applied Materials Israel, Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system for optical inspection
- Patent number 7,630,069
- Issue date Dec 8, 2009
- Applied Materials, Inc.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Grant
Field folding optical method for imaging system
- Patent number 7,586,596
- Issue date Sep 8, 2009
- Applied Materials, Israel, Ltd.
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Grant
Speckle reduction with transparent blocks
- Patent number 7,586,959
- Issue date Sep 8, 2009
- Applied Materials, Israel, Ltd.
- Doron Korngut
- G02 - OPTICS
Information Patent Grant
Method and apparatus for inspecting a sample having a controller fo...
- Patent number 7,504,647
- Issue date Mar 17, 2009
- Applied Materials, Inc.
- Gal Amar
- G01 - MEASURING TESTING
Information Patent Grant
Cascaded image intensifier
- Patent number 7,498,557
- Issue date Mar 3, 2009
- Applied Materials Israel Ltd.
- Iddo Pinkas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process and assembly for non-destructive surface inspection
- Patent number 7,463,351
- Issue date Dec 9, 2008
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection with alternating configurations
- Patent number 7,397,552
- Issue date Jul 8, 2008
- Applied Materials, Israel, Ltd.
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Grant
Dark field inspection system
- Patent number 7,339,661
- Issue date Mar 4, 2008
- Doron Korngut
- G01 - MEASURING TESTING
Information Patent Grant
System for imaging an extended area
- Patent number 7,286,697
- Issue date Oct 23, 2007
- Applied Materials, Israel, Ltd.
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system with oblique viewing angle
- Patent number 7,265,900
- Issue date Sep 4, 2007
- Applied Materials, Inc.
- Doron Korngut
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a sample having a height measur...
- Patent number 7,115,890
- Issue date Oct 3, 2006
- Applied Materials, Inc.
- Gal Amar
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspection of a substrate that has a refracti...
- Patent number 7,030,978
- Issue date Apr 18, 2006
- Applied Materials, Israel, Ltd.
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Grant
Process and assembly for non-destructive surface inspection
- Patent number 6,861,660
- Issue date Mar 1, 2005
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection system with dual detection heads
- Patent number 6,710,868
- Issue date Mar 23, 2004
- Applied Materials, Inc.
- Avishay Guetta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LASER DAYLIGHT DESIGNATION AND POINTING
- Publication number 20170241746
- Publication date Aug 24, 2017
- SHILAT OPTRONICS LTD
- AVISHAY GUETTA
- F41 - WEAPONS
Information Patent Application
FREE SPACE OPTICAL COMMUNICATION SYSTEM
- Publication number 20160020855
- Publication date Jan 21, 2016
- SHILAT OPTRONICS LTD
- AVISHAY GUETTA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TERRAIN SURVEILLANCE SYSTEM
- Publication number 20140168633
- Publication date Jun 19, 2014
- Avishay Guetta
- G08 - SIGNALLING
Information Patent Application
LASER DAYLIGHT DESIGNATION AND POINTING
- Publication number 20130087684
- Publication date Apr 11, 2013
- Avishay Guetta
- F41 - WEAPONS
Information Patent Application
THREE DIMENSIONAL MEASUREMENT SYSTEM
- Publication number 20130021595
- Publication date Jan 24, 2013
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION SYSTEM FOR OPTICAL INSPECTION
- Publication number 20110170090
- Publication date Jul 14, 2011
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Application
INTRUSION WARNING SYSTEM
- Publication number 20110043806
- Publication date Feb 24, 2011
- Avishay Guetta
- G08 - SIGNALLING
Information Patent Application
ILLUMINATION SYSTEM FOR OPTICAL INSPECTION
- Publication number 20100097680
- Publication date Apr 22, 2010
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Application
Cascaded image intensifier
- Publication number 20080272280
- Publication date Nov 6, 2008
- APPLIED MATERIALS ISRAEL LTD.
- Iddo Pinkas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETACHABLY COUPLED IMAGE INTENSIFIER AND IMAGE SENSOR
- Publication number 20080054166
- Publication date Mar 6, 2008
- APPLIED MATERIALS ISRAEL LTD.
- Tal KUZNIZ
- G01 - MEASURING TESTING
Information Patent Application
Multiple optical head inspection system and a method for imaging an...
- Publication number 20070222978
- Publication date Sep 27, 2007
- Applied Materials Israel Ltd.
- Emanuel Elyasaf
- G01 - MEASURING TESTING
Information Patent Application
Inspection System with Auto-Focus
- Publication number 20070034773
- Publication date Feb 15, 2007
- Gal Amar
- G01 - MEASURING TESTING
Information Patent Application
Illumination system for optical inspection
- Publication number 20070008519
- Publication date Jan 11, 2007
- APPLIED MATERIALS, INC.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Application
FIELD FOLDING OPTICAL METHOD FOR IMAGING SYSTEM
- Publication number 20070008520
- Publication date Jan 11, 2007
- APPLIED MATERIALS ISRAEL LTD.
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Application
Speckle reduction with transparent blocks
- Publication number 20060066870
- Publication date Mar 30, 2006
- Doron Korngut
- G02 - OPTICS
Information Patent Application
Optical inspection with alternating configurations
- Publication number 20060066843
- Publication date Mar 30, 2006
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Application
Inspection system with oblique viewing angle
- Publication number 20060007531
- Publication date Jan 12, 2006
- Doron Korengut
- G02 - OPTICS
Information Patent Application
Dark field inspection system
- Publication number 20050219518
- Publication date Oct 6, 2005
- Doron Korngut
- G01 - MEASURING TESTING
Information Patent Application
Process and assmebly for non-destructive surface inspection
- Publication number 20050179891
- Publication date Aug 18, 2005
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Application
Inspection system with auto-focus
- Publication number 20050167568
- Publication date Aug 4, 2005
- Gal Amar
- G01 - MEASURING TESTING
Information Patent Application
System and method for inspection of a substrate that has a refracti...
- Publication number 20040246474
- Publication date Dec 9, 2004
- Applied Materials Israel Ltd.
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Application
System for imaging an extended area
- Publication number 20040076322
- Publication date Apr 22, 2004
- Applied Materials Israel Ltd.
- Avishay Guetta
- G01 - MEASURING TESTING
Information Patent Application
Process and assembly for non-destructive surface inspection
- Publication number 20040016896
- Publication date Jan 29, 2004
- Applied Materials Israel, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION SYSTEM WITH DUAL DETECTION HEADS
- Publication number 20030218741
- Publication date Nov 27, 2003
- Applied Materials Israel Ltd.
- Avishay Guetta
- G01 - MEASURING TESTING

Avishay Guetta

Person

Patents Grantslast 30 patents

Free space optical communication system

Laser daylight designation and pointing

Terrain surveillance system

Laser daylight designation and pointing

Three dimensional measurement system

Intrusion warning system

Illumination system for optical inspection

Illumination system for optical inspection

Multiple optical head inspection system and a method for imaging an...

Illumination system for optical inspection

Field folding optical method for imaging system

Speckle reduction with transparent blocks

Method and apparatus for inspecting a sample having a controller fo...

Cascaded image intensifier

Process and assembly for non-destructive surface inspection

Optical inspection with alternating configurations

Dark field inspection system

System for imaging an extended area

Inspection system with oblique viewing angle

Method and apparatus for inspecting a sample having a height measur...

System and method for inspection of a substrate that has a refracti...

Process and assembly for non-destructive surface inspection

Optical inspection system with dual detection heads

Patents Applicationslast 30 patents

LASER DAYLIGHT DESIGNATION AND POINTING

FREE SPACE OPTICAL COMMUNICATION SYSTEM

TERRAIN SURVEILLANCE SYSTEM

LASER DAYLIGHT DESIGNATION AND POINTING

THREE DIMENSIONAL MEASUREMENT SYSTEM

ILLUMINATION SYSTEM FOR OPTICAL INSPECTION

INTRUSION WARNING SYSTEM

ILLUMINATION SYSTEM FOR OPTICAL INSPECTION

Cascaded image intensifier

DETACHABLY COUPLED IMAGE INTENSIFIER AND IMAGE SENSOR

Multiple optical head inspection system and a method for imaging an...

Inspection System with Auto-Focus

Illumination system for optical inspection

FIELD FOLDING OPTICAL METHOD FOR IMAGING SYSTEM

Speckle reduction with transparent blocks

Optical inspection with alternating configurations

Inspection system with oblique viewing angle

Dark field inspection system

Process and assmebly for non-destructive surface inspection

Inspection system with auto-focus

System and method for inspection of a substrate that has a refracti...

System for imaging an extended area

Process and assembly for non-destructive surface inspection

OPTICAL INSPECTION SYSTEM WITH DUAL DETECTION HEADS