Mumbai, IN
Information
Patent Grant
Applied Materials, Inc.
Avishek Ghosh
G01 - MEASURING TESTING
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Patent Grant
Applied Materials, Inc.
Avishek Ghosh
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Applied Materials, Inc.
Todd J. Egan
G01 - MEASURING TESTING
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Patent Grant
Applied Materials, Inc.
Mehdi Vaez-Iravani
G01 - MEASURING TESTING
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Patent Grant
Applied Materials, Inc.
Prerna Goradia
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Grant
Applied Materials, Inc.
Avishek Ghosh
G01 - MEASURING TESTING
Information
Patent Grant
Applied Materials, Inc.
Robert Jan Visser
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Applied Materials, Inc.
Robert Jan Visser
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Applied Materials, Inc.
Avishek GHOSH
G01 - MEASURING TESTING
Information
Patent Application
Applied Materials, Inc.
Todd J. Egan
G01 - MEASURING TESTING
Information
Patent Application
Applied Materials, Inc.
Mehdi VAEZ-IRAVANI
G01 - MEASURING TESTING
Information
Patent Application
Applied Materials, Inc.
Todd J. Egan
G01 - MEASURING TESTING
Information
Patent Application
Applied Materials, Inc.
Avishek GHOSH
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Applied Materials, Inc.
Robert Jan VISSER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Applied Materials, Inc.
Avishek GHOSH
G01 - MEASURING TESTING
Information
Patent Application
Applied Materials, Inc.
Robert Jan VISSER
G02 - OPTICS
Information
Patent Application
PRERNA GORADIA
G01 - MEASURING TESTING
