Membership
Tour
Register
Log in
Avneep Kumar Goyal
Follow
Person
Greater Noida, IN
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
ATPG testing method for latch based memories, for area reduction
Patent number
12,020,760
Issue date
Jun 25, 2024
STMICROELECTRONICS INTERNATIONAL N.V.
Venkata Narayanan Srinivasan
G11 - INFORMATION STORAGE
Information
Patent Grant
Systems and methods for preparing trace data
Patent number
11,914,499
Issue date
Feb 27, 2024
STMicroelectronics Application GmbH
Avneep Kumar Goyal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Debug and trace circuit in lockstep architectures, associated metho...
Patent number
11,892,505
Issue date
Feb 6, 2024
STMICROELECTRONICS INTERNATIONAL N.V.
Avneep Kumar Goyal
G01 - MEASURING TESTING
Information
Patent Grant
Glitch suppression apparatus and method
Patent number
11,687,428
Issue date
Jun 27, 2023
STMICROELECTRONICS INTERNATIONAL N.V.
Avneep Kumar Goyal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
ATPG testing method for latch based memories, for area reduction
Patent number
11,557,364
Issue date
Jan 17, 2023
STMICROELECTRONICS INTERNATIONAL N.V.
Venkata Narayanan Srinivasan
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
High speed debug-delay compensation in external tool
Patent number
11,360,143
Issue date
Jun 14, 2022
STMICROELECTRONICS INTERNATIONAL N.V.
Avneep Kumar Goyal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Immediate fail detect clock domain crossing synchronizer
Patent number
10,924,091
Issue date
Feb 16, 2021
STMICROELECTRONICS INTERNATIONAL N.V.
Avneep Kumar Goyal
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
SINGLE SIGNAL DEBUG PORT
Publication number
20240311227
Publication date
Sep 19, 2024
STMicroelectronics International N.V.
Avneep Kumar Goyal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ATPG TESTING METHOD FOR LATCH BASED MEMORIES, FOR AREA REDUCTION
Publication number
20240296899
Publication date
Sep 5, 2024
STMicroelectronics International N.V.
Venkata Narayanan SRINIVASAN
G11 - INFORMATION STORAGE
Information
Patent Application
RESET CIRCUITRY PROVIDING INDEPENDENT RESET SIGNAL FOR TRACE AND DE...
Publication number
20240241811
Publication date
Jul 18, 2024
STMicroelectronics International N.V.
Avneep Kumar GOYAL
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CONTROLLER AREA NETWORK EXTRA-LONG (CAN-XL) LOW LATENCY HARDWARE AN...
Publication number
20240243945
Publication date
Jul 18, 2024
STMicroelectronics International N.V.
Avneep Kumar GOYAL
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
GLITCH SUPPRESSION APPARATUS AND METHOD
Publication number
20230281092
Publication date
Sep 7, 2023
STMicroelectronics International N.V.
Avneep Kumar Goyal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR PREPARING TRACE DATA
Publication number
20230133912
Publication date
May 4, 2023
STMicroelectronics Application GmbH
Avneep Kumar Goyal
G01 - MEASURING TESTING
Information
Patent Application
CENTRAL CONTROLLER FOR MULTIPLE DEVELOPMENT PORTS
Publication number
20230133385
Publication date
May 4, 2023
STMicroelectronics Application GmbH
Avneep Kumar Goyal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ATPG TESTING METHOD FOR LATCH BASED MEMORIES, FOR AREA REDUCTION
Publication number
20230105305
Publication date
Apr 6, 2023
STMicroelectronics International N.V.
Venkata Narayanan SRINIVASAN
G11 - INFORMATION STORAGE
Information
Patent Application
ATPG TESTING METHOD FOR LATCH BASED MEMORIES, FOR AREA REDUCTION
Publication number
20230042541
Publication date
Feb 9, 2023
STMicroelectronics International N.V.
Venkata Narayanan SRINIVASAN
G11 - INFORMATION STORAGE
Information
Patent Application
GLITCH SUPPRESSION APPARATUS AND METHOD
Publication number
20220229752
Publication date
Jul 21, 2022
STMicroelectronics International N.V.
Avneep Kumar Goyal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HIGH SPEED DEBUG-DELAY COMPENSATION IN EXTERNAL TOOL
Publication number
20220137128
Publication date
May 5, 2022
STMicroelectronics International N.V.
Avneep Kumar GOYAL
G01 - MEASURING TESTING
Information
Patent Application
IMMEDIATE FAIL DETECT CLOCK DOMAIN CROSSING SYNCHRONIZER
Publication number
20210006237
Publication date
Jan 7, 2021
STMicroelectronics International N.V.
Avneep Kumar Goyal
H03 - BASIC ELECTRONIC CIRCUITRY