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Avner A. Shaulov
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Jerusalem, IL
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last 30 patents
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Patent Grant
Probe device for measuring a magnetic field vector
Patent number
6,366,085
Issue date
Apr 2, 2002
Bar-Ilan University
Yosef Yeshurun
G01 - MEASURING TESTING
Information
Patent Grant
AC magnetic susceptometer with odd harmonic measurement for analyzi...
Patent number
5,283,524
Issue date
Feb 1, 1994
U.S. Philips Corporation
Avner A. Shaulov
G01 - MEASURING TESTING
Information
Patent Grant
Methodology using odd harmonic components of an induced magnetic fi...
Patent number
5,280,240
Issue date
Jan 18, 1994
North American Philips Corporation
Avner A. Shaulov
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for mapping inhomogeneities on the surface of...
Patent number
5,030,912
Issue date
Jul 9, 1991
North American Philips Corp.
Samuel P. Herko
G01 - MEASURING TESTING