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Avner Rothschild
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Cambridge, MA, US
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last 30 patents
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Patent Application
Photo-induced sensitivity and selectivity of semiconductor gas sensors
Publication number
20080110241
Publication date
May 15, 2008
Avner Rothschild
G01 - MEASURING TESTING
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Patent Application
Photo-induced sensitivity and selectivity of semiconductor gas sensors
Publication number
20060000259
Publication date
Jan 5, 2006
Massachusetts Institute of Technology
Avner Rothschild
G01 - MEASURING TESTING