Avner SAFRANI

Person

Kibbutz Ein Dor, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Single grab overlay measurement of tall targets
- Patent number 12,066,322
- Issue date Aug 20, 2024
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining target feature focus in image-bas...
- Patent number 11,921,825
- Issue date Mar 5, 2024
- KLA Corporation
- Etay Lavert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic teaching of substrate handling for production and process...
- Patent number 11,908,722
- Issue date Feb 20, 2024
- KLA Corporation
- Avner Safrani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active reticle carrier for in situ stage correction
- Patent number 11,774,866
- Issue date Oct 3, 2023
- KLA Corporation
- Avner Safrani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for determining target feature focus in image-bas...
- Patent number 11,556,738
- Issue date Jan 17, 2023
- KLA Corporation
- Etay Lavert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging system for buried metrology targets
- Patent number 11,512,948
- Issue date Nov 29, 2022
- KLA Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Grant
Dual-interferometry wafer thickness gauge
- Patent number 10,782,120
- Issue date Sep 22, 2020
- KLA Corporation
- Avner Safrani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for photomask alignment and orientation character...
- Patent number 10,354,373
- Issue date Jul 16, 2019
- KLA-Tencor Corporation
- Avner Safrani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Real time dual mode full-field optical coherence microscopy with fu...
- Patent number 10,190,867
- Issue date Jan 29, 2019
- B.G. Negev Technologies and Applications Ltd., at Ben-Gurion University
- Avner Safrani
- G02 - OPTICS
Information Patent Grant
SWIR to visible up-conversion optical system
- Patent number 10,126,582
- Issue date Nov 13, 2018
- B. G. Negev Technologies and Applications, Ltd., at Ben-Gurion University
- Avner Safrani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple wavelengths real time phase shift interference microscopy
- Patent number 9,880,377
- Issue date Jan 30, 2018
- Photonicsys Ltd.
- Avner Safrani
- G02 - OPTICS
Information Patent Grant
True-spectroscopic dual mode high resolution full-field optical coh...
- Patent number 9,310,186
- Issue date Apr 12, 2016
- Ben-Gurion University of the Negev Research and Development Authority
- Ibrahim Abdulhalim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Laser-Beam Homogenization or Shaping
- Publication number 20240353686
- Publication date Oct 24, 2024
- KLA Corporation
- Avner Safrani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Teaching Substrate for Production and Process-Control Tools
- Publication number 20240170318
- Publication date May 23, 2024
- KLA Corporation
- Avner Safrani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE GRAB OVERLAY MEASUREMENT OF TALL TARGETS
- Publication number 20240159585
- Publication date May 16, 2024
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
3D PROFILOMETRY WITH A LINNIK INTERFEROMETER
- Publication number 20240035810
- Publication date Feb 1, 2024
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING TARGET FEATURE FOCUS IN IMAGE-BAS...
- Publication number 20240020353
- Publication date Jan 18, 2024
- KLA Corporation
- Etay Lavert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR ABSOLUTE SAMPLE POSITIONING
- Publication number 20220344192
- Publication date Oct 27, 2022
- KLA Corporation
- Yoav Grauer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AMD METHOD FOR DETERMINING TARGET FEATURE FOCUS IN IMAGE-BAS...
- Publication number 20220108128
- Publication date Apr 7, 2022
- KLA Corporation
- Etay Lavert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACTIVE RETICLE CARRIER FOR IN SITU STAGE CORRECTION
- Publication number 20220066333
- Publication date Mar 3, 2022
- KLA Corporation
- Avner Safrani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
IMAGING SYSTEM FOR BURIED METROLOGY TARGETS
- Publication number 20210372784
- Publication date Dec 2, 2021
- KLA Corporation
- Andrew V. Hill
- G01 - MEASURING TESTING
Information Patent Application
Automatic Teaching of Substrate Handling for Production and Process...
- Publication number 20210074567
- Publication date Mar 11, 2021
- KLA Corporation
- Avner Safrani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dual-Interferometry Wafer Thickness Gauge
- Publication number 20200011654
- Publication date Jan 9, 2020
- KLA-Tencor Corporation
- Avner Safrani
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Photomask Alignment and Orientation Character...
- Publication number 20180315179
- Publication date Nov 1, 2018
- KLA-Tencor Corporation
- Avner Safrani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SWIR TO VISIBLE UP-CONVERSION OPTICAL SYSTEM
- Publication number 20180203285
- Publication date Jul 19, 2018
- B.G. NEGEV TECHNOLOGIES AND APPLICATIONS LTD., at BEN-GURION UNIVERSITY
- Avner SAFRANI
- G02 - OPTICS
Information Patent Application
REAL TIME DUAL MODE FULL-FIELD OPTICAL COHERENCE MICROSCOPY WITH FU...
- Publication number 20170059299
- Publication date Mar 2, 2017
- B.G. NEGEV TECHNOLOGIES AND APPLICATIONS LTD., AT BEN-GURION UNIVERSITY
- Avner SAFRANI
- G02 - OPTICS
Information Patent Application
TRUE-SPECTROSCOPIC DUAL MODE HIGH RESOLUTION FULL-FIELD OPTICAL COH...
- Publication number 20150109623
- Publication date Apr 23, 2015
- BEN GURION UNIVERSITY OF THE NEGEV RESEARCH AND DEVELOPMENT AUTHORITY
- Ibrahim Abdulhalm
- G01 - MEASURING TESTING

Avner SAFRANI

Person

Patents Grantslast 30 patents

Single grab overlay measurement of tall targets

System and method for determining target feature focus in image-bas...

Automatic teaching of substrate handling for production and process...

Active reticle carrier for in situ stage correction

System and method for determining target feature focus in image-bas...

Imaging system for buried metrology targets

Dual-interferometry wafer thickness gauge

System and method for photomask alignment and orientation character...

Real time dual mode full-field optical coherence microscopy with fu...

SWIR to visible up-conversion optical system

Multiple wavelengths real time phase shift interference microscopy

True-spectroscopic dual mode high resolution full-field optical coh...

Patents Applicationslast 30 patents

Laser-Beam Homogenization or Shaping

Teaching Substrate for Production and Process-Control Tools

SINGLE GRAB OVERLAY MEASUREMENT OF TALL TARGETS

3D PROFILOMETRY WITH A LINNIK INTERFEROMETER

SYSTEM AND METHOD FOR DETERMINING TARGET FEATURE FOCUS IN IMAGE-BAS...

SYSTEMS AND METHODS FOR ABSOLUTE SAMPLE POSITIONING

SYSTEM AMD METHOD FOR DETERMINING TARGET FEATURE FOCUS IN IMAGE-BAS...

ACTIVE RETICLE CARRIER FOR IN SITU STAGE CORRECTION

IMAGING SYSTEM FOR BURIED METROLOGY TARGETS

Automatic Teaching of Substrate Handling for Production and Process...

Dual-Interferometry Wafer Thickness Gauge

System and Method for Photomask Alignment and Orientation Character...

SWIR TO VISIBLE UP-CONVERSION OPTICAL SYSTEM

REAL TIME DUAL MODE FULL-FIELD OPTICAL COHERENCE MICROSCOPY WITH FU...

TRUE-SPECTROSCOPIC DUAL MODE HIGH RESOLUTION FULL-FIELD OPTICAL COH...