Avraham Adler

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Nof Ayalon, IL

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Patents Grantslast 30 patents

Information Patent Grant
Multi-modal wide-angle illumination employing a compound beam combiner
- Patent number 11,977,211
- Issue date May 7, 2024
- Orbotech Ltd.
- David Fisch
- G02 - OPTICS
Information Patent Grant
Illumination angle control using dichroic filters
- Patent number 8,054,553
- Issue date Nov 8, 2011
- Orbotech Ltd.
- Avraham Adler
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection system employing a staring array scanner
- Patent number 6,864,498
- Issue date Mar 8, 2005
- Orbotech Ltd.
- Yigal Katzir
- G01 - MEASURING TESTING
Information Patent Grant
Illumination for inspecting surfaces of articles
- Patent number 6,832,843
- Issue date Dec 21, 2004
- Orbotech, Ltd.
- Avraham Adler
- G01 - MEASURING TESTING
Information Patent Grant
Illumination for inspecting surfaces of articles
- Patent number 6,437,312
- Issue date Aug 20, 2002
- Orbotech, Ltd.
- Avraham Adler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multi-Modal Wide-Angle Illumination Employing a Compound Beam Combiner
- Publication number 20240241358
- Publication date Jul 18, 2024
- ORBOTECH LTD.
- David Fisch
- G02 - OPTICS
Information Patent Application
Multi-Modal Wide-Angle Illumination Employing a Compound Beam Combiner
- Publication number 20220155574
- Publication date May 19, 2022
- ORBOTECH LTD.
- David Fisch
- G02 - OPTICS
Information Patent Application
ILLUMINATION ANGLE CONTROL USING DICHROIC FILTERS
- Publication number 20090310239
- Publication date Dec 17, 2009
- ORBOTECH LTD.
- Avraham ADLER
- G01 - MEASURING TESTING
Information Patent Application
Illumination for inspecting surfaces of articles
- Publication number 20020181233
- Publication date Dec 5, 2002
- ORBOTECH, LTD.
- Avraham Adler
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection system employing a staring array scanner
- Publication number 20020166983
- Publication date Nov 14, 2002
- ORBOTECH LTD.
- Yigal Katzir
- G01 - MEASURING TESTING