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Avron Zwilling
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Redmond, WA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Reference signal generating configuration for an interferometric mi...
Patent number
7,965,393
Issue date
Jun 21, 2011
Mitutoyo Corporation
Avron Zwilling
G01 - MEASURING TESTING
Information
Patent Grant
Precision measuring gauges with optical fiber output channels
Patent number
7,211,782
Issue date
May 1, 2007
Mitutoyo Corporation
Joseph D. Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Two-dimensional scale structures and method usable in an absolute p...
Patent number
6,781,694
Issue date
Aug 24, 2004
Mitutoyo Corporation
Michael Nahum
G01 - MEASURING TESTING
Information
Patent Grant
Scale structures and methods usable in an absolute position transducer
Patent number
6,664,535
Issue date
Dec 16, 2003
Mitutoyo Corporation
Michael Nahum
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
REFERENCE SIGNAL GENERATING CONFIGURATION FOR AN INTERFEROMETRIC MI...
Publication number
20090135435
Publication date
May 28, 2009
Mitutoyo Corporation
Avron Zwilling
G01 - MEASURING TESTING
Information
Patent Application
REFERENCE SIGNAL GENERATING CONFIGURATION FOR AN INTERFEROMETRIC MI...
Publication number
20090027692
Publication date
Jan 29, 2009
Mitutoyo Corporation
Avron Zwilling
G01 - MEASURING TESTING
Information
Patent Application
Precision measuring gauges with optical fiber output channels
Publication number
20050224705
Publication date
Oct 13, 2005
Joseph D. Tobiason
G02 - OPTICS
Information
Patent Application
TWO-DIMENSIONAL SCALE STRUCTURES AND METHOD USABLE IN AN ABSOLUTE P...
Publication number
20040012794
Publication date
Jan 22, 2004
Mitutoyo Corporation
Michael Nahum
G01 - MEASURING TESTING