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Axel Becker
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Dresden, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Probe systems and methods that utilize a flow-regulating structure...
Patent number
10,698,025
Issue date
Jun 30, 2020
FormFactor Beaverton, Inc.
Michael Teich
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for handling substrates at below dew point temp...
Patent number
9,377,423
Issue date
Jun 28, 2016
Cascade Microtech, Inc.
Botho Hirschfeld
G01 - MEASURING TESTING
Information
Patent Grant
Modular prober and method for operating same
Patent number
9,194,885
Issue date
Nov 24, 2015
Cascade Microtech, Inc.
Stojan Kanev
G01 - MEASURING TESTING
Information
Patent Grant
Arrangement and method for focusing a multiplane image acquisition...
Patent number
8,072,586
Issue date
Dec 6, 2011
Cascade Microtech, Inc.
Michael Teich
G02 - OPTICS
Information
Patent Grant
Method and apparatus for the correction of defective solder bump ar...
Patent number
8,044,320
Issue date
Oct 25, 2011
Enrico Herz
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Probe receptacle for mounting a probe for testing semiconductor com...
Patent number
7,560,942
Issue date
Jul 14, 2009
SUSS MicroTec Test Systems GmbH
Hans-Jurgen Fleischer
G01 - MEASURING TESTING
Information
Patent Grant
Adapter for positioning of contact tips
Patent number
7,463,044
Issue date
Dec 9, 2008
SUSS MicroTec Test Systems GmbH
Steffen Schott
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
WAFER-HANDLING END EFFECTORS CONFIGURED TO SELECTIVELY LIFT A WAFER...
Publication number
20240190019
Publication date
Jun 13, 2024
FormFactor, Inc.
Benedikt Marx
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
PROBE SYSTEMS AND METHODS FOR COLLECTING AN OPTICAL IMAGE OF A DEVI...
Publication number
20200025823
Publication date
Jan 23, 2020
FormFactor Beaverton, Inc.
Michael Teich
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR HANDLING SUBSTRATES AT BELOW DEW POINT TEMP...
Publication number
20140185649
Publication date
Jul 3, 2014
Cascade Microtech, Inc.
Botho Hirschfeld
G01 - MEASURING TESTING
Information
Patent Application
MODULAR PROBER AND METHOD FOR OPERATING SAME
Publication number
20140145743
Publication date
May 29, 2014
CASCADE MICOTECH, INC.
Stojan Kanev
G01 - MEASURING TESTING
Information
Patent Application
ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBER
Publication number
20110181710
Publication date
Jul 28, 2011
SUSS MicroTech Test Systems GmbH
Michael Teich
G02 - OPTICS
Information
Patent Application
ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION...
Publication number
20110013011
Publication date
Jan 20, 2011
SUSS MicroTec Test Systems GmbH
Michael Teich
G02 - OPTICS
Information
Patent Application
PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL
Publication number
20100045264
Publication date
Feb 25, 2010
SUSS MicroTec Test Systems GmbH
Jorg KIESEWETTER
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR FORMING A TEMPORARY ELECTRICAL CONTACT TO A...
Publication number
20100045265
Publication date
Feb 25, 2010
SUSS MicroTec Test Systems GmbH
Jorg KIESEWETTER
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
METHOD AND APPARATUS FOR THE CORRECTION OF DEFECTIVE SOLDER BUMP AR...
Publication number
20080173697
Publication date
Jul 24, 2008
SUSS MicroTec Test Systems GmbH
Enrico Herz
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBER
Publication number
20080158664
Publication date
Jul 3, 2008
SUSS MicroTec Test Systems GmbH
Michael Teich
G02 - OPTICS
Information
Patent Application
PROBE RECEPTACLE FOR MOUNTING A PROBE FOR TESTING SEMICONDUCTOR COM...
Publication number
20080116911
Publication date
May 22, 2008
SUSS MicroTec Test Systems GmbH
Hans-Jurgen FLEISCHER
G01 - MEASURING TESTING
Information
Patent Application
ADAPTER FOR POSITIONING OF CONTACT TIPS
Publication number
20070296402
Publication date
Dec 27, 2007
SUSS MicroTec Test Systems GmbH
Steffen Schott
G01 - MEASURING TESTING
Information
Patent Application
PROCESS FOR THE INSPECTION OF A VARIETY OF REPETITIVE STRUCTURES
Publication number
20070064992
Publication date
Mar 22, 2007
SUSS MicroTec Test Systems GmbH
Michael Teich
G06 - COMPUTING CALCULATING COUNTING